Hirokazu TAMAKI

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam apparatus and method for controlling charged...
- Patent number 11,791,131
- Issue date Oct 17, 2023
- HITACHI HIGH-TECH CORPORATION
- Takashi Dobashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and method of controlling charged p...
- Patent number 11,756,764
- Issue date Sep 12, 2023
- HITACHI HIGH-TECH CORPORATION
- Takashi Dobashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and control method thereof
- Patent number 11,742,172
- Issue date Aug 29, 2023
- HITACHI HIGH-TECH CORPORATION
- Takashi Dobashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam system
- Patent number 11,380,514
- Issue date Jul 5, 2022
- HITACHI HIGH-TECH CORPORATION
- Hirokazu Tamaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement system and method for setting observation conditions of...
- Patent number 11,380,518
- Issue date Jul 5, 2022
- Hitachi, Ltd.
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device for moving an aperture having pluralit...
- Patent number 10,636,621
- Issue date Apr 28, 2020
- Hitachi High-Technologies Corporation
- Akinari Hanawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and imaging method
- Patent number 10,535,497
- Issue date Jan 14, 2020
- Hitachi High-Technologies Corporation
- Hirokazu Tamaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and spherical aberration correction me...
- Patent number 9,715,991
- Issue date Jul 25, 2017
- Hitachi High-Technologies Corporation
- Yoichi Hirayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase plate and electron microscope
- Patent number 9,208,990
- Issue date Dec 8, 2015
- Hitachi High-Technologies Corporation
- Hirokazu Tamaki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20240420915
- Publication date Dec 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Mihiro TAKASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam System
- Publication number 20240186108
- Publication date Jun 6, 2024
- Hitachi High-Tech Corporation
- Hirokazu TAMAKI
- G01 - MEASURING TESTING
Information Patent Application
ABERRATION CORRECTOR AND ELECTRON MICROSCOPE
- Publication number 20240006148
- Publication date Jan 4, 2024
- HITACHI HIGH-TECH CORPORATION
- Hirokazu TAMAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM
- Publication number 20230093287
- Publication date Mar 23, 2023
- HITACHI HIGH-TECH CORPORATION
- Hirokazu TAMAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND METHOD FOR CONTROLLING CHARGED...
- Publication number 20220230844
- Publication date Jul 21, 2022
- HITACHI HIGH-TECH CORPORATION
- Takashi DOBASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND METHOD OF CONTROLLING CHARGED P...
- Publication number 20220216034
- Publication date Jul 7, 2022
- HITACHI HIGH-TECH CORPORATION
- Takashi DOBASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND CONTROL METHOD THEREOF
- Publication number 20220059313
- Publication date Feb 24, 2022
- Hitachi High-Tech Corporation
- Takashi Dobashi
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam System
- Publication number 20220005667
- Publication date Jan 6, 2022
- Hitachi High-Tech Corporation
- Hirokazu TAMAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Measurement System and Method for Setting Observation Conditions of...
- Publication number 20210407763
- Publication date Dec 30, 2021
- Hitachi, Ltd
- Takafumi MIWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE AND IMAGING METHOD
- Publication number 20190131107
- Publication date May 2, 2019
- Hitachi High-Technologies Corporation
- Hirokazu TAMAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Sample Observation Method
- Publication number 20180076004
- Publication date Mar 15, 2018
- Hitachi High-Technologies Corporation
- Akinari HANAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Spherical Aberration Correction Me...
- Publication number 20170117115
- Publication date Apr 27, 2017
- Hitachi High-Technologies Corporation
- Yoichi HIRAYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHASE PLATE AND ELECTRON MICROSCOPE
- Publication number 20140224988
- Publication date Aug 14, 2014
- Hirokazu Tamaki
- H01 - BASIC ELECTRIC ELEMENTS

Hirokazu TAMAKI

Person

Patents Grantslast 30 patents

Charged particle beam apparatus and method for controlling charged...

Charged particle beam apparatus and method of controlling charged p...

Charged particle beam device and control method thereof

Charged particle beam system

Measurement system and method for setting observation conditions of...

Charged particle beam device for moving an aperture having pluralit...

Electron microscope and imaging method

Charged particle beam device and spherical aberration correction me...

Phase plate and electron microscope

Patents Applicationslast 30 patents

CHARGED PARTICLE BEAM DEVICE

Charged Particle Beam System

ABERRATION CORRECTOR AND ELECTRON MICROSCOPE

CHARGED PARTICLE BEAM SYSTEM

CHARGED PARTICLE BEAM APPARATUS AND METHOD FOR CONTROLLING CHARGED...

CHARGED PARTICLE BEAM APPARATUS AND METHOD OF CONTROLLING CHARGED P...

CHARGED PARTICLE BEAM DEVICE AND CONTROL METHOD THEREOF

Charged Particle Beam System

Measurement System and Method for Setting Observation Conditions of...

ELECTRON MICROSCOPE AND IMAGING METHOD

Charged Particle Beam Device and Sample Observation Method

Charged Particle Beam Device and Spherical Aberration Correction Me...

PHASE PLATE AND ELECTRON MICROSCOPE