Hiroki AKASE

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Automatic analysis device
- Patent number 11,965,902
- Issue date Apr 23, 2024
- HITACHI HIGH-TECH CORPORATION
- Kei Shioya
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device and automatic analysis method
- Patent number 11,231,432
- Issue date Jan 25, 2022
- HITACHI HIGH-TECH CORPORATION
- Hiroki Akase
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Sample Conveying Device, Sample Analysis System, and Method for Con...
- Publication number 20240248106
- Publication date Jul 25, 2024
- Hitachi High-Tech Corporation
- Shinji AZUMA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE
- Publication number 20210080478
- Publication date Mar 18, 2021
- Hitachi High-Technologies Corporation
- Kei SHIOYA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
- Publication number 20190369131
- Publication date Dec 5, 2019
- Hitachi High-Technologies Corporation
- Hiroki AKASE
- G01 - MEASURING TESTING