Hiroki Ando

Person

  • Tokyo, JP

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    DC TEST APPARATUS

    • Publication number 20070262778
    • Publication date Nov 15, 2007
    • Advantest Corporation
    • Hiroki Ando
    • G01 - MEASURING TESTING
  • Information Patent Application

    Testing apparatus

    • Publication number 20050174105
    • Publication date Aug 11, 2005
    • Kunihiro Matsuura
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    Coaxial cable unit, test apparatus, and CPU system

    • Publication number 20050134255
    • Publication date Jun 23, 2005
    • Hironori Tanaka
    • G01 - MEASURING TESTING