Hiroki Andoh

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Measurement apparatus, test apparatus and measurement method
- Patent number 7,973,543
- Issue date Jul 5, 2011
- Advantest Corporation
- Hiroki Andoh
- G01 - MEASURING TESTING
Information Patent Grant
Voltage generating apparatus, current generating apparatus, and tes...
- Patent number 7,605,584
- Issue date Oct 20, 2009
- Advantest Corporation
- Hiroki Andoh
- G01 - MEASURING TESTING
Information Patent Grant
Voltage generating apparatus, current generating apparatus, and tes...
- Patent number 7,456,627
- Issue date Nov 25, 2008
- Advantest Corporation
- Hiroki Andoh
- G01 - MEASURING TESTING
Information Patent Grant
Voltage generating apparatus, current generating apparatus, and tes...
- Patent number 7,345,467
- Issue date Mar 18, 2008
- Advantest Corporation
- Hiroki Andoh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT APPARATUS, TEST APPARATUS AND MEASUREMENT METHOD
- Publication number 20100007327
- Publication date Jan 14, 2010
- Advantest Corporation
- HIROKI ANDOH
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE GENERATING APPARATUS, CURRENT GENERATING APPARATUS, AND TES...
- Publication number 20090072802
- Publication date Mar 19, 2009
- Advantest Corporation
- Hiroki Andoh
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE GENERATING APPARATUS, CURRENT GENERATING APPARATUS, AND TES...
- Publication number 20080088287
- Publication date Apr 17, 2008
- Advantest Corporation
- Hiroki Andoh
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE GENERATING APPARATUS, CURRENT GENERATING APPARATUS, AND TES...
- Publication number 20080074133
- Publication date Mar 27, 2008
- Advantest Corporation
- Hiroki Andoh
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE GENERATING APPARATUS, CURRENT GENERATING APPARATUS, AND TES...
- Publication number 20070296400
- Publication date Dec 27, 2007
- Advantest Corporation
- Hiroki Andoh
- G01 - MEASURING TESTING