Hiroki Ichikawa

Person

Hachioji, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 8,687,444
- Issue date Apr 1, 2014
- Elpida Memory, Inc.
- Akira Ide
- G11 - INFORMATION STORAGE
Information Patent Grant
Output apparatus and test apparatus
- Patent number 8,324,947
- Issue date Dec 4, 2012
- Advantest Corporation
- Hiroki Ichikawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Remote control device for tape recorder
- Patent number 4,488,196
- Issue date Dec 11, 1984
- Olympus Optical Co., Ltd.
- Hideo Takenaga
- G11 - INFORMATION STORAGE
Information Patent Grant
Seesaw type switch mechanism
- Patent number 4,401,864
- Issue date Aug 30, 1983
- Olympus Optical Company Ltd.
- Hiroki Ichikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tape recorder having interlocked tape speed and tone control adjust...
- Patent number 4,325,094
- Issue date Apr 13, 1982
- Olympus Optical Co., Ltd.
- Hiroki Ichikawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Tape recorder
- Patent number 4,300,735
- Issue date Nov 17, 1981
- Olympus Optical Co., Ltd.
- Hiroki Ichikawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Dual tread plate foot switch
- Patent number 4,164,637
- Issue date Aug 14, 1979
- Olympus Optical Co., Ltd.
- Kazumi Miyazi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mechanism to prevent unwanted tape ejection in a magnetic tape device
- Patent number 4,135,220
- Issue date Jan 16, 1979
- Olympus Optical Co., Ltd.
- Hiroki Ichikawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic tape drive device
- Patent number 4,126,284
- Issue date Nov 21, 1978
- Olympus Optical Co., Ltd.
- Hiroki Ichikawa
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATIC TEST EQUIPMENT
- Publication number 20240027520
- Publication date Jan 25, 2024
- Advantest Corporation
- Hiroki ICHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT
- Publication number 20240027521
- Publication date Jan 25, 2024
- Advantest Corporation
- Hiroki ICHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT
- Publication number 20240027523
- Publication date Jan 25, 2024
- Advantest Corporation
- Hiroki ICHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
TEST CARRIER
- Publication number 20150168448
- Publication date Jun 18, 2015
- Advantest Corporation
- Kiyoto Nakamura
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20120182816
- Publication date Jul 19, 2012
- Akira Ide
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor device and manufacturing method thereof
- Publication number 20120075944
- Publication date Mar 29, 2012
- Elpida Memory, Inc.
- Akira Ide
- G11 - INFORMATION STORAGE
Information Patent Application
OUTPUT APPARATUS AND TEST APPARATUS
- Publication number 20110298522
- Publication date Dec 8, 2011
- Advantest Corporation
- Hiroki ICHIKAWA
- H03 - BASIC ELECTRONIC CIRCUITRY

Hiroki Ichikawa

Person

Patents Grantslast 30 patents

Semiconductor device and manufacturing method thereof

Output apparatus and test apparatus

Remote control device for tape recorder

Seesaw type switch mechanism

Tape recorder having interlocked tape speed and tone control adjust...

Tape recorder

Dual tread plate foot switch

Mechanism to prevent unwanted tape ejection in a magnetic tape device

Magnetic tape drive device

Patents Applicationslast 30 patents

AUTOMATIC TEST EQUIPMENT

AUTOMATIC TEST EQUIPMENT

AUTOMATIC TEST EQUIPMENT

TEST CARRIER

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

Semiconductor device and manufacturing method thereof

OUTPUT APPARATUS AND TEST APPARATUS