Hiroki Ihara

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Shiroi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Specimen conveyance device and specimen processing system
- Patent number 10,613,107
- Issue date Apr 7, 2020
- Hitachi High-Technologies Corporation
- Toshiki Yamagata
- G01 - MEASURING TESTING
Information Patent Grant
Specimen container inclination correction mechanism, and method for...
- Patent number 10,551,398
- Issue date Feb 4, 2020
- Hitachi High-Technologies Corporation
- Kazuma Tamura
- G01 - MEASURING TESTING
Information Patent Grant
Chemical analysis apparatus and chemical analysis cartridge
- Patent number 7,727,472
- Issue date Jun 1, 2010
- Hitachi High-Technologies Corporation
- Yoshihiro Nagaoka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPECIMEN INSPECTION AUTOMATION SYSTEM
- Publication number 20180246131
- Publication date Aug 30, 2018
- Hitachi High-Technologies Corporation
- Shigeki YAMAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN CONTAINER INCLINATION CORRECTION MECHANISM, AND METHOD FOR...
- Publication number 20180120339
- Publication date May 3, 2018
- Hitachi High-Technologies Corporation
- Kazuma TAMURA
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN CONVEYANCE DEVICE AND SPECIMEN PROCESSING SYSTEM
- Publication number 20180074085
- Publication date Mar 15, 2018
- Hitachi High-Technologies Corporation
- Toshiki YAMAGATA
- G01 - MEASURING TESTING
Information Patent Application
Chemical analyzer and cartridge for chemical analyzer
- Publication number 20060245972
- Publication date Nov 2, 2006
- Yasuo Osone
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Chemical analysis apparatus and chemical analysis cartridge
- Publication number 20060153735
- Publication date Jul 13, 2006
- Yoshihiro Nagaoka
- G01 - MEASURING TESTING