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Hiroki Kimura
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Kumagaya, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device
Patent number
9,293,578
Issue date
Mar 22, 2016
Hitachi, Ltd.
Tomoyuki Miyoshi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Switch circuit, filter circuit and test apparatus
Patent number
8,232,808
Issue date
Jul 31, 2012
Advantest Corporation
Hiroki Kimura
G01 - MEASURING TESTING
Information
Patent Grant
Signal reading apparatus and test apparatus
Patent number
7,796,164
Issue date
Sep 14, 2010
Advantest Corporation
Hiroki Kimura
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Buffer circuit, amplifier circuit, and test apparatus
Patent number
7,652,466
Issue date
Jan 26, 2010
Advantest Corporation
Hiroki Kimura
G01 - MEASURING TESTING
Information
Patent Grant
Oscillating apparatus
Patent number
7,612,590
Issue date
Nov 3, 2009
Advantest Corporation
Hiroki Kimura
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Test apparatus, manufacturing method, and test method
Patent number
7,612,698
Issue date
Nov 3, 2009
Advantest Corporation
Hiroki Kimura
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Oscillating apparatus
Patent number
7,605,621
Issue date
Oct 20, 2009
Advantest Corporation
Hiroki Kimura
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Oscillation detecting apparatus and test apparatus
Patent number
7,034,562
Issue date
Apr 25, 2006
Advantest Corporation
Hiroki Kimura
G01 - MEASURING TESTING
Information
Patent Grant
Calibration circuit for calibrating frequency characteristics of an...
Patent number
5,933,013
Issue date
Aug 3, 1999
Advantest Corp.
Hiroki Kimura
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20150041883
Publication date
Feb 12, 2015
Hitachi, Ltd.
Hiroki Kimura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20140284714
Publication date
Sep 25, 2014
Kenji Miyakoshi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20140015049
Publication date
Jan 16, 2014
Hitachi, Ltd.
Tomoyuki Miyoshi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SWITCH CIRCUIT, FILTER CIRCUIT AND TEST APPARATUS
Publication number
20090230978
Publication date
Sep 17, 2009
Advantest Corporation
HIROKI KIMURA
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
OSCILLATING APPARATUS
Publication number
20090079480
Publication date
Mar 26, 2009
Advantest Corporation
HIROKI KIMURA
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
TEST APPARATUS, MANUFACTURING METHOD, AND TEST METHOD
Publication number
20090033528
Publication date
Feb 5, 2009
Advantest Corporation
Hiroki Kimura
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
BUFFER CIRCUIT, AMPLIFIER CIRCUIT, AND TEST APPARATUS
Publication number
20090027041
Publication date
Jan 29, 2009
Advantest Corporation
HIROKI KIMURA
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
OSCILLATING APPARATUS
Publication number
20080157835
Publication date
Jul 3, 2008
Advantest Corporation
HIROKI KIMURA
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Signal reading apparatus and test apparatus
Publication number
20070146524
Publication date
Jun 28, 2007
Advantest Corporation
Hiroki Kimura
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Oscillation detecting apparatus and test apparatus
Publication number
20050258855
Publication date
Nov 24, 2005
Hiroki Kimura
G01 - MEASURING TESTING