Hiroki Koike

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Storage circuit provided with variable resistance type elements, an...
- Patent number 11,705,176
- Issue date Jul 18, 2023
- Tohoku University
- Tetsuo Endoh
- G11 - INFORMATION STORAGE
Information Patent Grant
Storage circuit provided with variable resistance elements, referen...
- Patent number 11,514,964
- Issue date Nov 29, 2022
- Tohoku University
- Hiroki Koike
- G11 - INFORMATION STORAGE
Information Patent Grant
System, method, and non-transitory computer readable recording medi...
- Patent number 10,783,294
- Issue date Sep 22, 2020
- Tohoku University
- Masanori Natsui
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory circuit provided with variable-resistance element
- Patent number 10,665,282
- Issue date May 26, 2020
- Tohoku University
- Hiroki Koike
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit
- Patent number 9,466,363
- Issue date Oct 11, 2016
- Tohoku University
- Tetsuo Endoh
- G11 - INFORMATION STORAGE
Information Patent Grant
Resonance calculation program and analyzing apparatus
- Patent number 8,837,663
- Issue date Sep 16, 2014
- Mitsubishi Heavy Industries, Ltd.
- Hiroki Koike
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Nuclear-characteristic calculating program and analyzing apparatus
- Patent number 8,583,409
- Issue date Nov 12, 2013
- Mitsubishi Heavy Industries, Ltd.
- Kazuya Yamaji
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Resonance calculation program and analyzing apparatus
- Patent number 8,583,376
- Issue date Nov 12, 2013
- Mitsubishi Heavy Industries, Ltd.
- Hiroki Koike
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Semiconductor memory device and testing system and testing method
- Patent number 6,922,799
- Issue date Jul 26, 2005
- NEC Corporation
- Hiroki Koike
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device capable of generating offset voltage in...
- Patent number 6,288,950
- Issue date Sep 11, 2001
- NEC Corporation
- Hiroki Koike
- G11 - INFORMATION STORAGE
Information Patent Grant
Ferroelectric memory device using a ferroelectric material and meth...
- Patent number 5,940,316
- Issue date Aug 17, 1999
- NEC Corporation
- Hiroki Koike
- G11 - INFORMATION STORAGE
Information Patent Grant
Ferroelectric memory device
- Patent number 5,926,413
- Issue date Jul 20, 1999
- NEC Corporation
- Junichi Yamada
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-volatile ferroelectric memory device equipped with reference vo...
- Patent number 5,694,353
- Issue date Dec 2, 1997
- NEC Corporation
- Hiroki Koike
- G11 - INFORMATION STORAGE
Information Patent Grant
Ferroelectric memory device
- Patent number 5,671,174
- Issue date Sep 23, 1997
- NEC Corporation
- Hiroki Koike
- G11 - INFORMATION STORAGE
Information Patent Grant
Ferroelectric memory and method for controlling operation of the same
- Patent number 5,668,753
- Issue date Sep 16, 1997
- NEC Corporation
- Hiroki Koike
- G11 - INFORMATION STORAGE
Information Patent Grant
Ferroelectric memory and method for controlling operation of the same
- Patent number 5,617,349
- Issue date Apr 1, 1997
- NEC Corporation
- Hiroki Koike
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-volatile ferroelectric memory device with leakage preventing fu...
- Patent number 5,615,144
- Issue date Mar 25, 1997
- NEC Corporation
- Tohru Kimura
- G11 - INFORMATION STORAGE
Information Patent Grant
Ferroelectric memory and method for controlling operation of the same
- Patent number 5,610,852
- Issue date Mar 11, 1997
- NEC Corporation
- Hiroki Koike
- G11 - INFORMATION STORAGE
Information Patent Grant
Ferroelectric random-access memory
- Patent number 5,600,587
- Issue date Feb 4, 1997
- NEC Corporation
- Hiroki Koike
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory data protection for a ferroelectric memory
- Patent number 5,574,679
- Issue date Nov 12, 1996
- NEC Corporation
- Tetsuya Ohtsuki
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device comprising a grounding pad near a reference si...
- Patent number 5,557,235
- Issue date Sep 17, 1996
- NEC Corporation
- Hiroki Koike
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor memory device with redundant decoder available for te...
- Patent number 5,544,106
- Issue date Aug 6, 1996
- NEC Corporation
- Hiroki Koike
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic memory having a ground control circuit
- Patent number 5,495,443
- Issue date Feb 27, 1996
- NEC Corporation
- Hiroki Koike
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit device having parallel signal wiri...
- Patent number 5,473,195
- Issue date Dec 5, 1995
- NEC Corporation
- Hiroki Koike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device with single data line pair shared betwe...
- Patent number 5,392,242
- Issue date Feb 21, 1995
- NEC Corporation
- Hiroki Koike
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic random access memory device with refreshing system powered...
- Patent number 5,337,282
- Issue date Aug 9, 1994
- NEC Corporation
- Hiroki Koike
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory circuit
- Patent number 5,202,854
- Issue date Apr 13, 1993
- NEC Corporation
- Hiroki Koike
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
STORAGE CIRCUIT PROVIDED WITH VARIABLE RESISTANCE TYPE ELEMENTS
- Publication number 20220406366
- Publication date Dec 22, 2022
- TOHOKU UNIVERSITY
- Hiroki Koike
- G11 - INFORMATION STORAGE
Information Patent Application
STORAGE CIRCUIT PROVIDED WITH VARIABLE RESISTANCE TYPE ELEMENTS, AN...
- Publication number 20220172761
- Publication date Jun 2, 2022
- TOHOKU UNIVERSITY
- Tetsuo Endoh
- G11 - INFORMATION STORAGE
Information Patent Application
COVARIANCE DATA CREATION APPARATUS, REACTOR CORE ANALYSIS APPARATUS...
- Publication number 20200395138
- Publication date Dec 17, 2020
- Mitsubishi Heavy Industries, Ltd.
- Hiroki Koike
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
STORAGE CIRCUIT PROVIDED WITH VARIABLE RESISTANCE TYPE ELEMENT, AND...
- Publication number 20200381032
- Publication date Dec 3, 2020
- Hiroki KOIKE
- G11 - INFORMATION STORAGE
Information Patent Application
CIRCUIT DESIGN SUPPORT SYSTEM, CIRCUIT DESIGN SUPPORT METHOD, CIRCU...
- Publication number 20190243929
- Publication date Aug 8, 2019
- TOHOKU UNIVERSITY
- Masanori NATSUI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY CIRCUIT PROVIDED WITH VARIABLE-RESISTANCE ELEMENT
- Publication number 20180350419
- Publication date Dec 6, 2018
- TOHOKU UNIVERSITY
- Hiroki Koike
- G11 - INFORMATION STORAGE
Information Patent Application
INTEGRATED CIRCUIT
- Publication number 20140355330
- Publication date Dec 4, 2014
- TOHOKU UNIVERSITY
- Tetsuo Endoh
- G11 - INFORMATION STORAGE
Information Patent Application
RESONANCE CALCULATION PROGRAM AND ANALYZING APPARATUS
- Publication number 20120215444
- Publication date Aug 23, 2012
- Mitsubishi Heavy Industries, Ltd.
- Hiroki Koike
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
NUCLEAR-CHARACTERISTIC CALCULATING PROGRAM AND ANALYZING APPARATUS
- Publication number 20120209576
- Publication date Aug 16, 2012
- Mitsubishi Heavy Industries, Ltd.
- Kazuya Yamaji
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
RESONANCE CALCULATION PROGRAM AND ANALYZING APPARATUS
- Publication number 20120057667
- Publication date Mar 8, 2012
- Mitsubishi Heavy Industries, Ltd.
- Hiroki Koike
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Semiconductor memory device and testing system and testing method
- Publication number 20010055229
- Publication date Dec 27, 2001
- Hiroki Koike
- G11 - INFORMATION STORAGE

Hiroki Koike

Person

Patents Grantslast 30 patents

Storage circuit provided with variable resistance type elements, an...

Storage circuit provided with variable resistance elements, referen...

System, method, and non-transitory computer readable recording medi...

Memory circuit provided with variable-resistance element

Integrated circuit

Resonance calculation program and analyzing apparatus

Nuclear-characteristic calculating program and analyzing apparatus

Resonance calculation program and analyzing apparatus

Semiconductor memory device and testing system and testing method

Semiconductor memory device capable of generating offset voltage in...

Ferroelectric memory device using a ferroelectric material and meth...

Ferroelectric memory device

Non-volatile ferroelectric memory device equipped with reference vo...

Ferroelectric memory device

Ferroelectric memory and method for controlling operation of the same

Ferroelectric memory and method for controlling operation of the same

Non-volatile ferroelectric memory device with leakage preventing fu...

Ferroelectric memory and method for controlling operation of the same

Ferroelectric random-access memory

Memory data protection for a ferroelectric memory

Semiconductor device comprising a grounding pad near a reference si...

Semiconductor memory device with redundant decoder available for te...

Dynamic memory having a ground control circuit

Semiconductor integrated circuit device having parallel signal wiri...

Semiconductor memory device with single data line pair shared betwe...

Dynamic random access memory device with refreshing system powered...

Semiconductor memory circuit

Patents Applicationslast 30 patents

STORAGE CIRCUIT PROVIDED WITH VARIABLE RESISTANCE TYPE ELEMENTS

STORAGE CIRCUIT PROVIDED WITH VARIABLE RESISTANCE TYPE ELEMENTS, AN...

COVARIANCE DATA CREATION APPARATUS, REACTOR CORE ANALYSIS APPARATUS...

STORAGE CIRCUIT PROVIDED WITH VARIABLE RESISTANCE TYPE ELEMENT, AND...

CIRCUIT DESIGN SUPPORT SYSTEM, CIRCUIT DESIGN SUPPORT METHOD, CIRCU...

MEMORY CIRCUIT PROVIDED WITH VARIABLE-RESISTANCE ELEMENT

INTEGRATED CIRCUIT

RESONANCE CALCULATION PROGRAM AND ANALYZING APPARATUS

NUCLEAR-CHARACTERISTIC CALCULATING PROGRAM AND ANALYZING APPARATUS

RESONANCE CALCULATION PROGRAM AND ANALYZING APPARATUS

Semiconductor memory device and testing system and testing method