Hiroki KOTAKE

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Kobe-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sample measurement device and sample measurement method
- Patent number 12,078,648
- Issue date Sep 3, 2024
- Sysmex Corporation
- Masaki Shiba
- G01 - MEASURING TESTING
Information Patent Grant
Method of cleaning aspiration tube and specimen measuring apparatus
- Patent number 11,666,920
- Issue date Jun 6, 2023
- Sysmex Corporation
- Kota Misawa
- B08 - CLEANING
Information Patent Grant
Sample measuring system and sample measuring method
- Patent number 11,400,455
- Issue date Aug 2, 2022
- Sysmex Corporation
- Hiroki Kotake
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE MEASUREMENT DEVICE AND SAMPLE MEASUREMENT METHOD
- Publication number 20200309801
- Publication date Oct 1, 2020
- SYSMEX CORPORATION
- Masaki SHIBA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CLEANING ASPIRATION TUBE AND SPECIMEN MEASURING APPARATUS
- Publication number 20200306804
- Publication date Oct 1, 2020
- SYSMEX CORPORATION
- Kota MISAWA
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SAMPLE MEASURING SYSTEM AND SAMPLE MEASURING METHOD
- Publication number 20190232296
- Publication date Aug 1, 2019
- SYSMEX CORPORATION
- Hiroki KOTAKE
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL