Hiroki NAGASHIMA

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Itabashi-ku, JP

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Patents Grantslast 30 patents

Information Patent Grant
Measuring device, measuring method, and programs therefor
- Patent number 10,802,145
- Issue date Oct 13, 2020
- Topcon Corporation
- Hiroki Nagashima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring device, measuring method, and programs therefor
- Patent number 10,302,483
- Issue date May 28, 2019
- Topcon Corporation
- Hiroki Nagashima
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device, measuring method, and programs therefor
- Patent number 10,240,976
- Issue date Mar 26, 2019
- TOPCON CORPORATION
- Hiroki Nagashima
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic wave measuring device, electromagnetic wave measuri...
- Patent number 10,145,735
- Issue date Dec 4, 2018
- TOPCON CORPORATION
- Hiroki Nagashima
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASURING DEVICE, MEASURING METHOD, AND PROGRAMS THEREFOR
- Publication number 20190317215
- Publication date Oct 17, 2019
- TOPCON CORPORATION
- Hiroki NAGASHIMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASURING DEVICE, MEASURING METHOD, AND PROGRAMS THEREFOR
- Publication number 20170115161
- Publication date Apr 27, 2017
- TOPCON CORPORATION
- Hiroki NAGASHIMA
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC WAVE MEASURING DEVICE, ELECTROMAGNETIC WAVE MEASURI...
- Publication number 20170097262
- Publication date Apr 6, 2017
- TOPCON CORPORATION
- Hiroki NAGASHIMA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE, MEASURING METHOD, AND PROGRAMS THEREFOR
- Publication number 20170097260
- Publication date Apr 6, 2017
- TOPCON CORPORATION
- Hiroki NAGASHIMA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE, MEASURING METHOD, AND PROGRAMS THEREFOR
- Publication number 20170097420
- Publication date Apr 6, 2017
- TOPCON CORPORATION
- Hiroki NAGASHIMA
- G01 - MEASURING TESTING