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Hiroki NEGISHI
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Absolute encoder
Patent number
12,104,928
Issue date
Oct 1, 2024
MINEBEA MITSUMI INC.
Katsunori Saito
G01 - MEASURING TESTING
Information
Patent Grant
Absolute encoder
Patent number
12,092,453
Issue date
Sep 17, 2024
MINEBEA MITSUMI INC.
Katsunori Saito
G01 - MEASURING TESTING
Information
Patent Grant
Reduction mechanism and absolute encoder
Patent number
11,913,784
Issue date
Feb 27, 2024
MINEBEA MITSUMI INC.
Yasuo Osada
G01 - MEASURING TESTING
Information
Patent Grant
Absolute encoder
Patent number
11,906,300
Issue date
Feb 20, 2024
MINEBEA MITSUMI INC.
Katsunori Saito
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ABSOLUTE ENCODER
Publication number
20240418541
Publication date
Dec 19, 2024
MINEBEA MITSUMI INC.
Katsunori SAITO
G01 - MEASURING TESTING
Information
Patent Application
ABSOLUTE ENCODER
Publication number
20240175670
Publication date
May 30, 2024
MINEBEA MITSUMI Inc.
Katsunori SAITO
G01 - MEASURING TESTING
Information
Patent Application
ABSOLUTE ENCODER
Publication number
20220196380
Publication date
Jun 23, 2022
MINEBEA MITSUMI INC.
Katsunori SAITO
G01 - MEASURING TESTING
Information
Patent Application
ABSOLUTE ENCODER
Publication number
20220170731
Publication date
Jun 2, 2022
MINEBEA MITSUMI INC.
Katsunori SAITO
G01 - MEASURING TESTING
Information
Patent Application
ABSOLUTE ENCODER
Publication number
20220163317
Publication date
May 26, 2022
MINEBEA MITSUMI INC.
Katsunori SAITO
G01 - MEASURING TESTING
Information
Patent Application
REDUCTION MECHANISM AND ABSOLUTE ENCODER
Publication number
20220163318
Publication date
May 26, 2022
MINEBEA MITSUMI INC.
Yasuo OSADA
G01 - MEASURING TESTING