Hiroki Nishida

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and designing method thereof
- Patent number 10,418,325
- Issue date Sep 17, 2019
- Renesas Electronics Corporation
- Hiroki Nishida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor testing device
- Patent number 6,784,686
- Issue date Aug 31, 2004
- Renesas Technology Corp.
- Hiroki Nishida
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND DESIGNING METHOD THEREOF
- Publication number 20170263550
- Publication date Sep 14, 2017
- RENESAS ELECTRONICS CORPORATION
- Hiroki NISHIDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor testing device
- Publication number 20040103357
- Publication date May 27, 2004
- RENESAS TECHNOLOGY CORP.
- Hiroki Nishida
- G01 - MEASURING TESTING