TREA

Hiroki Shikagawa

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  • Yamanashi, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Testing system
    • Patent number 11,454,664
    • Issue date Sep 27, 2022
    • Tokyo Electron Limited
    • Kentaro Konishi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Inspection system
    • Patent number 11,067,624
    • Issue date Jul 20, 2021
    • Tokyo Electron Limited
    • Kentaro Konishi
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

  • Information Patent Application

    TESTING SYSTEM
    • Publication number 20210333319
    • Publication date Oct 28, 2021
    • TOKYO ELECTRON LIMITED
    • Kentaro KONISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    INSPECTION SYSTEM
    • Publication number 20200158775
    • Publication date May 21, 2020
    • Kentaro Konishi
    • G01 - MEASURING TESTING