Hiroki Tabuchi

Person

Nara, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Photomask utilizing auxiliary pattern that is not transferred with...
- Patent number 6,103,428
- Issue date Aug 15, 2000
- Sharp Kabushiki Kaisha
- Tetsuya Hatai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for forming a fine resist pattern
- Patent number 5,480,047
- Issue date Jan 2, 1996
- Sharp Kabushiki Kaisha
- Makoto Tanigawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithographic process for producing small mask apertures and product...
- Patent number 5,403,685
- Issue date Apr 4, 1995
- Sharp Kabushiki Kaisha
- David A. Vidusek
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mask for photolithography
- Patent number 5,389,474
- Issue date Feb 14, 1995
- Sharp Kabushiki Kaisha
- Katsuji Iguchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Defect inspection system for phase shift masks
- Patent number 5,353,116
- Issue date Oct 4, 1994
- Sharp Kabushiki Kaisha
- Makoto Tanigawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for forming resist mask pattern by light exposure having a p...
- Patent number 5,330,862
- Issue date Jul 19, 1994
- Sharp Kabushiki Kaisha
- Hiroki Tabuchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Moisture-sensitive device
- Patent number 5,048,336
- Issue date Sep 17, 1991
- Sharp Kabushiki Kaisha
- Takashi Sugihara
- G01 - MEASURING TESTING
Information Patent Grant
Sensor
- Patent number 4,928,513
- Issue date May 29, 1990
- Sharp Kabushiki Kaisha
- Takashi Sugihara
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing platinum resistance thermometer
- Patent number 4,805,296
- Issue date Feb 21, 1989
- Sharp Kabushiki Kaisha
- Akihito Jinda
- G01 - MEASURING TESTING
Information Patent Grant
Platinum resistor for the measurement of temperatures
- Patent number 4,649,365
- Issue date Mar 10, 1987
- Sharp Kabushiki Kaisha
- Hisatoshi Furubayashi
- G01 - MEASURING TESTING

Hiroki Tabuchi

Person

Patents Grantslast 30 patents

Photomask utilizing auxiliary pattern that is not transferred with...

Method for forming a fine resist pattern

Lithographic process for producing small mask apertures and product...

Mask for photolithography

Defect inspection system for phase shift masks

Method for forming resist mask pattern by light exposure having a p...

Moisture-sensitive device

Sensor

Method of manufacturing platinum resistance thermometer

Platinum resistor for the measurement of temperatures