Hiroki Takaishi

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Thermal analysis device, sample holder assembly and thermal analysi...
- Patent number 11,353,415
- Issue date Jun 7, 2022
- Netzsch-Gerätebau GmbH
- Hiroki Takaishi
- G01 - MEASURING TESTING
Information Patent Grant
Gas analysis device and gas analysis method
- Patent number 11,320,408
- Issue date May 3, 2022
- Netzsch-Gerätebau GmbH
- Ryoichi Kinoshita
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Thermal Analysis Device, Sample Holder Assembly And Thermal Analysi...
- Publication number 20210088460
- Publication date Mar 25, 2021
- Netzsch-Gerätebau GmbH
- Hiroki Takaishi
- G01 - MEASURING TESTING
Information Patent Application
Gas Analysis Device and Gas Analysis Method
- Publication number 20210088485
- Publication date Mar 25, 2021
- Netzsch-Gerätebau GmbH
- Ryoichi Kinoshita
- H01 - BASIC ELECTRIC ELEMENTS