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Hiroki Taniguchi
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Kyoto, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor integrated circuit device having a dummy metal wiring...
Patent number
8,159,013
Issue date
Apr 17, 2012
Panasonic Corporation
Hidetoshi Nishimura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Standard cell and semiconductor device including the same
Patent number
8,143,724
Issue date
Mar 27, 2012
Panasonic Corporation
Ritsuko Ozoe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Standard cell and semiconductor device including the same
Patent number
8,022,549
Issue date
Sep 20, 2011
Panasonic Corporation
Ritsuko Ozoe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Standard cell and semiconductor device including the same
Patent number
7,859,023
Issue date
Dec 28, 2010
Panasonic Corporation
Ritsuko Ozoe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device
Patent number
7,777,512
Issue date
Aug 17, 2010
Panasonic Corporation
Masaya Hirose
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor integrated circuit and method of designing the same
Patent number
7,334,210
Issue date
Feb 19, 2008
Matsushita Electric Industrial Co., Ltd.
Yoichi Matsumura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Scan flip-flop circuit, logic macro, scan test circuit, and method...
Patent number
6,920,594
Issue date
Jul 19, 2005
Matsushita Electric Industrial Co., Ltd.
Hiroki Taniguchi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
STANDARD CELL AND SEMICONDUCTOR DEVICE INCLUDING THE SAME
Publication number
20110298138
Publication date
Dec 8, 2011
PANASONIC CORPORATION
Ritsuko OZOE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
STANDARD CELL AND SEMICONDUCTOR DEVICE INCLUDING THE SAME
Publication number
20110079914
Publication date
Apr 7, 2011
PANASONIC CORPORATION
Ritsuko OZOE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
Publication number
20100187699
Publication date
Jul 29, 2010
Hidetoshi Nishimura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20080309378
Publication date
Dec 18, 2008
Matsushita Electric Industrial Co. Ltd.
Masaya Hirose
G01 - MEASURING TESTING
Information
Patent Application
STANDARD CELL AND SEMICONDUCTOR DEVICE INCLUDING THE SAME
Publication number
20080246160
Publication date
Oct 9, 2008
Ritsuko Ozoe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor integrated circuit and method of designing the same
Publication number
20080141202
Publication date
Jun 12, 2008
Matsushita Electric Industrial Co., Ltd.
Yoichi Matsumura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Semiconductor integrated circuit designing method and library desig...
Publication number
20060271902
Publication date
Nov 30, 2006
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Kyoji Yamashita
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Semiconductor integrated circuit and method for designing same
Publication number
20060253822
Publication date
Nov 9, 2006
Matsushita Electric Industrial Co., Ltd.
Yoichi Matsumura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Semiconductor integrated circuit and method for designing same
Publication number
20060253823
Publication date
Nov 9, 2006
Matsushita Electric Industrial Co., Ltd.
Yoichi Matsumura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Semiconductor integrated circuit and method of designing the same
Publication number
20050097492
Publication date
May 5, 2005
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Yoichi Matsumura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method for processing design data of semiconductor integrated circuit
Publication number
20050086621
Publication date
Apr 21, 2005
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Yoichi Matsumura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Semiconductor integrated circuit and method for designing same
Publication number
20050060676
Publication date
Mar 17, 2005
Yoichi Matsumura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Scan flip-flop circuit, logic macro, scan test circuit, and method...
Publication number
20020184584
Publication date
Dec 5, 2002
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Hiroki Taniguchi
G01 - MEASURING TESTING