Hiroki Yamanaka

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Kunitachi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Delay fault diagnosis program
- Patent number 8,392,776
- Issue date Mar 5, 2013
- Hitachi, Ltd.
- Daisuke Ito
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DELAY FAULT DIAGNOSIS PROGRAM
- Publication number 20100269003
- Publication date Oct 21, 2010
- Hitachi, Ltd.
- Daisuke ITO
- G01 - MEASURING TESTING
Information Patent Application
EDA TOOL, SEMICONDUCTOR DEVICE, AND SCAN CHAIN CONFIGURATION METHOD
- Publication number 20100169727
- Publication date Jul 1, 2010
- RENESAS TECHNOLOGY CORP.
- Daisuke ITO
- G01 - MEASURING TESTING