Hiroki Yamoto

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Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Locking apparatus and loadboard assembly
- Patent number 6,747,447
- Issue date Jun 8, 2004
- Advantest Corporation
- Niels Markert
- G01 - MEASURING TESTING
Information Patent Grant
Test head Hifix for semiconductor device testing apparatus
- Patent number 6,710,590
- Issue date Mar 23, 2004
- Advantest Corporation
- Niels Markert
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor test system storing pin calibration data, commands an...
- Publication number 20040181731
- Publication date Sep 16, 2004
- ADVANTEST CORPORATION
- Rochit Rajsuman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Locking apparatus and loadboard assembly
- Publication number 20040056675
- Publication date Mar 25, 2004
- ADVANTEST CORPORATION
- Niels Markert
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor test system storing pin calibration data in non-volat...
- Publication number 20030110427
- Publication date Jun 12, 2003
- ADVANTEST CORPORATION
- Rochit Rajsuman
- G01 - MEASURING TESTING