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Hiroki YAZAWA
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Yokohama-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Structured illumination microscopic device and structured illuminat...
Patent number
10,393,661
Issue date
Aug 27, 2019
Nikon Corporation
Fumihiro Dake
G01 - MEASURING TESTING
Information
Patent Grant
Observation device including illumination optical system and extrac...
Patent number
10,222,334
Issue date
Mar 5, 2019
Nikon Corporation
Fumihiro Dake
G02 - OPTICS
Information
Patent Grant
Super-resolution observation device and super-resolution observatio...
Patent number
10,054,545
Issue date
Aug 21, 2018
Nikon Corporation
Fumihiro Dake
G02 - OPTICS
Information
Patent Grant
Microscope system
Patent number
9,261,690
Issue date
Feb 16, 2016
Nikon Corporation
Naoki Fukutake
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
SUPER-RESOLUTION OBSERVATION DEVICE AND SUPER-RESOLUTION OBSERVATIO...
Publication number
20170082545
Publication date
Mar 23, 2017
Nikon Corporation
Fumihiro DAKE
G02 - OPTICS
Information
Patent Application
SUPER-RESOLUTION OBSERVATION DEVICE AND SUPER-RESOLUTION OBSERVATIO...
Publication number
20170082546
Publication date
Mar 23, 2017
Nikon Corporation
Fumihiro DAKE
G02 - OPTICS
Information
Patent Application
STRUCTURED ILLUMINATION MICROSCOPIC DEVICE AND STRUCTURED ILLUMINAT...
Publication number
20170038300
Publication date
Feb 9, 2017
Nikon Corporation
Fumihiro DAKE
G02 - OPTICS
Information
Patent Application
MICROSCOPE SYSTEM
Publication number
20120293644
Publication date
Nov 22, 2012
NIKON CORPORATION
Naoki FUKUTAKE
G02 - OPTICS