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Hiroko MIKI
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Kawasaki Kanagawa, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Molecule detecting device and molecule detecting method
Patent number
11,635,428
Issue date
Apr 25, 2023
Kabushiki Kaisha Toshiba
Hiroko Miki
G01 - MEASURING TESTING
Information
Patent Grant
Particle inspection system and driving method employed therein
Patent number
10,533,934
Issue date
Jan 14, 2020
Kabushiki Kaisha Toshiba
Michihiko Nishigaki
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor micro-analysis chip and method of manufacturing the same
Patent number
10,279,348
Issue date
May 7, 2019
Kabushiki Kaisha Toshiba
Hiroko Miki
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Analysis package for detecting particles in a sample liquid
Patent number
9,895,691
Issue date
Feb 20, 2018
Kabushiki Kaisha Toshiba
Hiroshi Hamasaki
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Analysis package for detecting particles in a sample liquid includi...
Patent number
9,885,680
Issue date
Feb 6, 2018
Kabushiki Kaisha Toshiba
Hiroshi Hamasaki
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Analysis package for detecting particles in a sample liquid, and in...
Patent number
9,770,714
Issue date
Sep 26, 2017
Kabushiki Kaisha Toshiba
Hiroshi Hamasaki
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Semiconductor device and method of manufacturing the same
Patent number
8,338,911
Issue date
Dec 25, 2012
Kabushiki Kaisha Toshiba
Hiroko Miki
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
CHEMICAL SENSOR, REAGENT, AND METHOD FOR DETECTING BENZOIC ACID AND...
Publication number
20240280529
Publication date
Aug 22, 2024
Kabushiki Kaisha Toshiba
Hiroko MIKI
G01 - MEASURING TESTING
Information
Patent Application
CHEMICAL SENSOR USING STRAND EXCHANGE REACTION
Publication number
20240110229
Publication date
Apr 4, 2024
Kabushiki Kaisha Toshiba
Yoshiaki SUGIZAKI
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
METHOD FOR INSPECTING PROBE MOLECULE
Publication number
20240027350
Publication date
Jan 25, 2024
Kabushiki Kaisha Toshiba
Hiroko MIKI
G01 - MEASURING TESTING
Information
Patent Application
FET SENSOR USING ANTIOXIDANT
Publication number
20230304964
Publication date
Sep 28, 2023
Kabushiki Kaisha Toshiba
Yoshiaki SUGIZAKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHEMICAL SENSOR DEVICE AND METHOD FOR DETECTING TARGET SUBSTANCE
Publication number
20230296576
Publication date
Sep 21, 2023
Kabushiki Kaisha Toshiba
Yoshiaki SUGIZAKI
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR IMMOBILIZING NUCLEIC ACID COMPOUND, REAGENT KIT, AND SENSOR
Publication number
20230194516
Publication date
Jun 22, 2023
Kabushiki Kaisha Toshiba
Hiroko MIKI
B82 - NANO-TECHNOLOGY
Information
Patent Application
CHEMICAL SENSOR MODULE AND METHOD FOR IDENTIFYING SAMPLE SUBSTANCES
Publication number
20220308012
Publication date
Sep 29, 2022
Kabushiki Kaisha Toshiba
Yoshiaki SUGIZAKI
G01 - MEASURING TESTING
Information
Patent Application
CHEMICAL SENSOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
Publication number
20220298550
Publication date
Sep 22, 2022
Kabushiki Kaisha Toshiba
Hiroko MIKI
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
MOLECULE DETECTING DEVICE AND MOLECULE DETECTING METHOD
Publication number
20210293802
Publication date
Sep 23, 2021
Kabushiki Kaisha Toshiba
Hiroko Miki
G01 - MEASURING TESTING
Information
Patent Application
SENSOR, REAGENT, METHOD FOR MANUFACTURING PROBE MOLECULE, AND METHO...
Publication number
20190062818
Publication date
Feb 28, 2019
KABUSHIKI KAISHA TOSHIBA
Hiroko Miki
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
DETECTION DEVICE, DETECTION METHOD, AND ELECTRODE WITH PROBE
Publication number
20190064157
Publication date
Feb 28, 2019
Kabushiki Kaisha Toshiba
Takuya MIYAGAWA
G01 - MEASURING TESTING
Information
Patent Application
PARTICLE INSPECTION SYSTEM AND DRIVING METHOD EMPLOYED THEREIN
Publication number
20170122859
Publication date
May 4, 2017
Kabushiki Kaisha Toshiba
Michihiko NISHIGAKI
G01 - MEASURING TESTING
Information
Patent Application
PARTICLE INSPECTION UNIT AND PARTICLE INSPECTION SYSTEM
Publication number
20160320286
Publication date
Nov 3, 2016
Kabushiki Kaisha Toshiba
Hiroko MIKI
G01 - MEASURING TESTING
Information
Patent Application
ANALYSIS PACKAGE
Publication number
20160231265
Publication date
Aug 11, 2016
Kabushiki Kaisha Toshiba
Hiroshi HAMASAKI
G01 - MEASURING TESTING
Information
Patent Application
ANALYSIS PACKAGE
Publication number
20160231262
Publication date
Aug 11, 2016
Kabushiki Kaisha Toshiba
Hiroshi HAMASAKI
G01 - MEASURING TESTING
Information
Patent Application
ANALYSIS PACKAGE
Publication number
20160231263
Publication date
Aug 11, 2016
Kabushiki Kaisha Toshiba
Hiroshi HAMASAKI
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR MICRO-ANALYSIS CHIP AND METHOD OF MANUFACTURING THE SAME
Publication number
20150041316
Publication date
Feb 12, 2015
Kabushiki Kaisha Toshiba
Hiroko MIKI
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR MICRO-ANALYSIS CHIP AND SAMPLE LIQUID FLOWING METHOD
Publication number
20140256031
Publication date
Sep 11, 2014
Kabushiki Kaisha Toshiba
Kentaro KOBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
Publication number
20110309517
Publication date
Dec 22, 2011
Kabushiki Kaisha Toshiba
Hiroko Miki
H01 - BASIC ELECTRIC ELEMENTS