Hiromi Chaya

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probing apparatus and positional deviation acquiring method
- Patent number 7,477,064
- Issue date Jan 13, 2009
- Tokyo Electron Limited
- Daiki Kurihara
- G01 - MEASURING TESTING
Information Patent Grant
Probe mark reading device and probe mark reading method
- Patent number 7,224,175
- Issue date May 29, 2007
- Dainippon Screen Mfg. Co., Ltd.
- Hiromi Chaya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Probe apparatus with optical length-measuring unit and probe testin...
- Patent number 7,221,177
- Issue date May 22, 2007
- Tokyo Electron Limited
- Shigekazu Komatsu
- G01 - MEASURING TESTING
Information Patent Grant
Probe mark reading device and probe mark reading method
- Patent number 7,026,832
- Issue date Apr 11, 2006
- Dainippon Screen Mfg. Co., Ltd.
- Hiromi Chaya
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Probing apparatus and positional deviation acquiring method
- Publication number 20060238905
- Publication date Oct 26, 2006
- TOKYO ELECTRON LIMITED
- Daiki Kurihara
- G01 - MEASURING TESTING
Information Patent Application
Probe mark reading device and probe mark reading method
- Publication number 20060139628
- Publication date Jun 29, 2006
- Dainippon Screen Mfg. Co., Ltd.
- Hiromi Chaya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Probe apparatus with optical length-measuring unit and probe testin...
- Publication number 20050253613
- Publication date Nov 17, 2005
- TOKYO ELECTRON LIMITED
- Shigekazu Komatsu
- G01 - MEASURING TESTING
Information Patent Application
Probe mark reading device and probe mark reading method
- Publication number 20040081349
- Publication date Apr 29, 2004
- Dainippon Screen Mfg, Co., Ltd.
- Hiromi Chaya
- G06 - COMPUTING CALCULATING COUNTING