Hiromi Deguchi

Person

Shimotsuke-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Control method of shape measuring apparatus
- Patent number 10,724,840
- Issue date Jul 28, 2020
- Mitutoyo Corporation
- Takashi Noda
- G01 - MEASURING TESTING
Information Patent Grant
Method for controlling shape measuring apparatus
- Patent number 10,379,520
- Issue date Aug 13, 2019
- Mitutoyo Corporation
- Takashi Noda
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for controlling shape measuring apparatus
- Patent number 10,274,297
- Issue date Apr 30, 2019
- Mitutoyo Corporation
- Takashi Noda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Control method of profile measuring apparatus
- Patent number 9,964,392
- Issue date May 8, 2018
- Mitutoyo Corporation
- Takashi Noda
- G01 - MEASURING TESTING
Information Patent Grant
Shape measuring apparatus and control method of shape measuring app...
- Patent number 9,448,052
- Issue date Sep 20, 2016
- Mitutoyo Corporation
- Takashi Noda
- G05 - CONTROLLING REGULATING
Information Patent Grant
Form measuring apparatus and form measurement method
- Patent number 9,366,522
- Issue date Jun 14, 2016
- Mitutoyo Corporation
- Takashi Noda
- G01 - MEASURING TESTING
Information Patent Grant
Shape measuring apparatus
- Patent number 9,298,178
- Issue date Mar 29, 2016
- Mitutoyo Corporation
- Takashi Noda
- G05 - CONTROLLING REGULATING
Information Patent Grant
Corrected ball diameter calculating method and form measuring instr...
- Patent number 9,151,602
- Issue date Oct 6, 2015
- Mitutoyo Corporation
- Takashi Noda
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, method and program for measuring surface texture
- Patent number 7,643,963
- Issue date Jan 5, 2010
- Mitutoyo Corporation
- Takashi Noda
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibrating scanning probe and computer-readable medium...
- Patent number 6,701,268
- Issue date Mar 2, 2004
- Mitutoyo Corporation
- Takashi Noda
- G01 - MEASURING TESTING
Information Patent Grant
V-groove shape measuring method and apparatus by using rotary table
- Patent number 6,460,261
- Issue date Oct 8, 2002
- Mitutoyo Corporation
- Takashi Noda
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
CONTROL METHOD OF SHAPE MEASURING APPARATUS
- Publication number 20180149458
- Publication date May 31, 2018
- MITUTOYO CORPORATION
- Takashi NODA
- G01 - MEASURING TESTING
Information Patent Application
CONTROL METHOD OF PROFILE MEASURING APPARATUS
- Publication number 20180017954
- Publication date Jan 18, 2018
- MITUTOYO CORPORATION
- Takashi NODA
- G01 - MEASURING TESTING
Information Patent Application
CONTROL METHOD OF PROFILE MEASURING APPARATUS
- Publication number 20170115109
- Publication date Apr 27, 2017
- MITUTOYO CORPORATION
- Takashi NODA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CONTROLLING SHAPE MEASURING APPARATUS
- Publication number 20170090455
- Publication date Mar 30, 2017
- Mitutoyo Corporation
- Takashi Noda
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CONTROLLING SHAPE MEASURING APPARATUS
- Publication number 20160356591
- Publication date Dec 8, 2016
- MITUTOYO CORPORATION
- Takashi NODA
- G01 - MEASURING TESTING
Information Patent Application
FORM MEASURING APPARATUS AND FORM MEASUREMENT METHOD
- Publication number 20150143708
- Publication date May 28, 2015
- MITUTOYO CORPORATION
- Takashi NODA
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASURING APPARATUS AND CONTROL METHOD OF SHAPE MEASURING APP...
- Publication number 20140025336
- Publication date Jan 23, 2014
- Takashi NODA
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASURING APPARATUS
- Publication number 20130310962
- Publication date Nov 21, 2013
- MITUTOYO CORPORATION
- Takashi NODA
- G01 - MEASURING TESTING
Information Patent Application
CORRECTED BALL DIAMETER CALCULATING METHOD AND FORM MEASURING INSTR...
- Publication number 20100250178
- Publication date Sep 30, 2010
- Mitutoyo Corporation
- Takashi Noda
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, METHOD AND PROGRAM FOR MEASURING SURFACE TEXTURE
- Publication number 20080236260
- Publication date Oct 2, 2008
- Mitutoyo Corporation
- Takashi Noda
- G01 - MEASURING TESTING
Information Patent Application
Method for calibrating scanning probe and computer-readable medium...
- Publication number 20030069709
- Publication date Apr 10, 2003
- Mitutoyo Corporation
- Takashi Noda
- G01 - MEASURING TESTING

Hiromi Deguchi

Person

Patents Grantslast 30 patents

Control method of shape measuring apparatus

Method for controlling shape measuring apparatus

Method for controlling shape measuring apparatus

Control method of profile measuring apparatus

Shape measuring apparatus and control method of shape measuring app...

Form measuring apparatus and form measurement method

Shape measuring apparatus

Corrected ball diameter calculating method and form measuring instr...

Apparatus, method and program for measuring surface texture

Method for calibrating scanning probe and computer-readable medium...

V-groove shape measuring method and apparatus by using rotary table

Patents Applicationslast 30 patents

CONTROL METHOD OF SHAPE MEASURING APPARATUS

CONTROL METHOD OF PROFILE MEASURING APPARATUS

CONTROL METHOD OF PROFILE MEASURING APPARATUS

METHOD FOR CONTROLLING SHAPE MEASURING APPARATUS

METHOD FOR CONTROLLING SHAPE MEASURING APPARATUS

FORM MEASURING APPARATUS AND FORM MEASUREMENT METHOD

SHAPE MEASURING APPARATUS AND CONTROL METHOD OF SHAPE MEASURING APP...

SHAPE MEASURING APPARATUS

CORRECTED BALL DIAMETER CALCULATING METHOD AND FORM MEASURING INSTR...

APPARATUS, METHOD AND PROGRAM FOR MEASURING SURFACE TEXTURE

Method for calibrating scanning probe and computer-readable medium...