Hiromi Inada

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning electron microscope
- Patent number 9,305,745
- Issue date Apr 5, 2016
- Hitachi High-Technologies Corporation
- Wataru Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope and scanning transmission electron mic...
- Patent number 8,878,130
- Issue date Nov 4, 2014
- Hitachi High-Technologies Corporation
- Hiromi Inada
- G01 - MEASURING TESTING
Information Patent Grant
Scanning transmission electron microscope and axial adjustment meth...
- Patent number 8,710,438
- Issue date Apr 29, 2014
- Hitachi High-Technologies Corporation
- Kuniyasu Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam equipment and charged particle microscopy
- Patent number 8,304,722
- Issue date Nov 6, 2012
- Hitachi High-Technologies Corporation
- Hiromi Inada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam equipment
- Patent number 7,923,701
- Issue date Apr 12, 2011
- Hitachi High-Technologies Corporation
- Hiromi Inada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam equipment with magnification correction
- Patent number 7,649,172
- Issue date Jan 19, 2010
- Hitachi High-Technologies Corporation
- Masaru Ozawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for observing a specimen in a field of view of an...
- Patent number 7,544,936
- Issue date Jun 9, 2009
- Hitachi, Ltd.
- Hiromi Inada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam equipment and charged particle microscopy
- Patent number 7,435,957
- Issue date Oct 14, 2008
- Hitachi High-Technologies Corporation
- Hiromi Inada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number D571385
- Issue date Jun 17, 2008
- Hitachi High-Technologies Corporation
- Mitsuru Onuma
- D16 - Photography and optical equipment
Information Patent Grant
Charged particle beam equipment
- Patent number 7,375,330
- Issue date May 20, 2008
- Hitachi High-Technologies Corporation
- Hiromi Inada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle system and a method for measuring image magnification
- Patent number 7,372,047
- Issue date May 13, 2008
- Hitachi High-Technologies Corporation
- Mitsugu Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electric charged particle beam microscopy, electric charged particl...
- Patent number 7,372,051
- Issue date May 13, 2008
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for observing a specimen in a field of view of an...
- Patent number 7,164,129
- Issue date Jan 16, 2007
- Hitachi, Ltd.
- Hiromi Inada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron microscope
- Patent number 7,126,120
- Issue date Oct 24, 2006
- Hitachi High-Technologies Corporation
- Hiromi Inada
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for observing a specimen in a field of view of an...
- Patent number 7,022,989
- Issue date Apr 4, 2006
- Hitachi, Ltd.
- Hiromi Inada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for observing a specimen in a field of view of an...
- Patent number 7,012,254
- Issue date Mar 14, 2006
- Hitachi, Ltd.
- Hiromi Inada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for observing a specimen in a field of view of an...
- Patent number 6,878,934
- Issue date Apr 12, 2005
- Hitachi, Ltd.
- Hiromi Inada
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20150034824
- Publication date Feb 5, 2015
- Hitachi High-Technologies Corporation
- Wataru Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND SCANNING TRANSMISSION ELECTRON MIC...
- Publication number 20140138542
- Publication date May 22, 2014
- Hitachi High-Technologies Corporation
- Hiromi Inada
- G01 - MEASURING TESTING
Information Patent Application
SCANNING TRANSMISSION ELECTRON MICROSCOPE AND AXIAL ADJUSTMENT METH...
- Publication number 20130112875
- Publication date May 9, 2013
- Hitachi High-Technologies Corporation
- Kuniyasu Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam equipment
- Publication number 20090242794
- Publication date Oct 1, 2009
- Hitachi High-Technologies Corporation
- Hiromi Inada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM EQUIPMENT AND CHARGED PARTICLE MICROSCOPY
- Publication number 20090084955
- Publication date Apr 2, 2009
- Hitachi High-Technologies Corporation
- Hiromi Inada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam equipment
- Publication number 20080067380
- Publication date Mar 20, 2008
- Hitachi High-Technologies Corporation
- Masaru Ozawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and device for observing a specimen in a field of view of an...
- Publication number 20070176103
- Publication date Aug 2, 2007
- Hiromi Inada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged particle beam equipment
- Publication number 20060219908
- Publication date Oct 5, 2006
- Hitachi High-Technologies Corporation
- Hiromi Inada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam equipment and charged particle microscopy
- Publication number 20060151697
- Publication date Jul 13, 2006
- Hitachi High-Technologies Corporation
- Hiromi Inada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and device for observing a specimen in a field of view of an...
- Publication number 20060097169
- Publication date May 11, 2006
- Hiromi Inada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electric charged particle beam microscopy, electric charged particl...
- Publication number 20060038125
- Publication date Feb 23, 2006
- Ruriko Tsuneta
- G01 - MEASURING TESTING
Information Patent Application
Charged particle system and a method for measuring image magnification
- Publication number 20050189501
- Publication date Sep 1, 2005
- Mitsugu Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron microscope
- Publication number 20050072920
- Publication date Apr 7, 2005
- Hitachi High-Technologies Corporation
- Hiromi Inada
- G01 - MEASURING TESTING
Information Patent Application
Method and device for observing a specimen in a field of view of an...
- Publication number 20050035293
- Publication date Feb 17, 2005
- Hiromi Inada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and device for observing a specimen in a field of view of an...
- Publication number 20040173749
- Publication date Sep 9, 2004
- Hiromi Inada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and device for observing a specimen in a field of view of an...
- Publication number 20020027199
- Publication date Mar 7, 2002
- Hiromi Inada
- G01 - MEASURING TESTING

Hiromi Inada

Person

Patents Grantslast 30 patents

Scanning electron microscope

Scanning electron microscope and scanning transmission electron mic...

Scanning transmission electron microscope and axial adjustment meth...

Charged particle beam equipment and charged particle microscopy

Charged particle beam equipment

Charged particle beam equipment with magnification correction

Method and device for observing a specimen in a field of view of an...

Charged particle beam equipment and charged particle microscopy

Electron microscope

Charged particle beam equipment

Charged particle system and a method for measuring image magnification

Electric charged particle beam microscopy, electric charged particl...

Method and device for observing a specimen in a field of view of an...

Electron microscope

Method and device for observing a specimen in a field of view of an...

Method and device for observing a specimen in a field of view of an...

Method and device for observing a specimen in a field of view of an...

Patents Applicationslast 30 patents

SCANNING ELECTRON MICROSCOPE

SCANNING ELECTRON MICROSCOPE AND SCANNING TRANSMISSION ELECTRON MIC...

SCANNING TRANSMISSION ELECTRON MICROSCOPE AND AXIAL ADJUSTMENT METH...

Charged particle beam equipment

CHARGED PARTICLE BEAM EQUIPMENT AND CHARGED PARTICLE MICROSCOPY

Charged particle beam equipment

Method and device for observing a specimen in a field of view of an...

Charged particle beam equipment

Charged particle beam equipment and charged particle microscopy

Method and device for observing a specimen in a field of view of an...

Electric charged particle beam microscopy, electric charged particl...

Charged particle system and a method for measuring image magnification

Electron microscope

Method and device for observing a specimen in a field of view of an...

Method and device for observing a specimen in a field of view of an...

Method and device for observing a specimen in a field of view of an...