Hiromi Kuramochi

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Chiba-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probe for a scanning magnetic force microscope, method for producin...
- Patent number 7,495,215
- Issue date Feb 24, 2009
- National Institute of Advanced Industrial Science and Technology
- Hiroyuki Akinaga
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE FOR A SCANNING MAGNETIC FORCE MICROSCOPE, METHOD FOR PRODUCIN...
- Publication number 20080166560
- Publication date Jul 10, 2008
- NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Hiroyuki Akinaga
- G01 - MEASURING TESTING