Hiromi MISE

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Transmission electron microscope and inspection method using transm...
- Patent number 12,170,184
- Issue date Dec 17, 2024
- HITACHI HIGH-TECH CORPORATION
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 12,131,882
- Issue date Oct 29, 2024
- HITACHI HIGH-TECH CORPORATION
- Shuntaro Ito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and method for controlling charged...
- Patent number 11,791,131
- Issue date Oct 17, 2023
- HITACHI HIGH-TECH CORPORATION
- Takashi Dobashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and method of controlling charged p...
- Patent number 11,756,764
- Issue date Sep 12, 2023
- HITACHI HIGH-TECH CORPORATION
- Takashi Dobashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and control method thereof
- Patent number 11,742,172
- Issue date Aug 29, 2023
- HITACHI HIGH-TECH CORPORATION
- Takashi Dobashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging device and morphological feature data display method
- Patent number 11,321,585
- Issue date May 3, 2022
- HITACHI HIGH-TECH CORPORATION
- Yaku Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam device, method for processing sample, and obs...
- Patent number 11,268,915
- Issue date Mar 8, 2022
- HITACHI HIGH-TECH CORPORATION
- Tsunenori Nomaguchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam System
- Publication number 20240186108
- Publication date Jun 6, 2024
- Hitachi High-Tech Corporation
- Hirokazu TAMAKI
- G01 - MEASURING TESTING
Information Patent Application
Analysis System
- Publication number 20230377836
- Publication date Nov 23, 2023
- Hitachi High-Tech Corporation
- Azusa KONNO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transmission Electron Microscope and Inspection Method Using Transm...
- Publication number 20220244201
- Publication date Aug 4, 2022
- Hitachi High-Tech Corporation
- Toshie YAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20220230840
- Publication date Jul 21, 2022
- Hitachi High-Tech Corporation
- Shuntaro ITO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND METHOD FOR CONTROLLING CHARGED...
- Publication number 20220230844
- Publication date Jul 21, 2022
- HITACHI HIGH-TECH CORPORATION
- Takashi DOBASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND METHOD OF CONTROLLING CHARGED P...
- Publication number 20220216034
- Publication date Jul 7, 2022
- HITACHI HIGH-TECH CORPORATION
- Takashi DOBASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND CONTROL METHOD THEREOF
- Publication number 20220059313
- Publication date Feb 24, 2022
- Hitachi High-Tech Corporation
- Takashi Dobashi
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Device, Method for Processing Sample, and Obs...
- Publication number 20210190703
- Publication date Jun 24, 2021
- Hitachi High-Tech Corporation
- Tsunenori NOMAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
Imaging Device and Morphological Feature Data Display Method
- Publication number 20200125894
- Publication date Apr 23, 2020
- Hitachi High-Technologies Corporation
- Yaku MAEDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged Particle Beam Apparatus and Cell Evaluation Method
- Publication number 20200056141
- Publication date Feb 20, 2020
- Hitachi High-Technologies Corporation
- Akira IKEUCHI
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...

Hiromi MISE

Person

Patents Grantslast 30 patents

Transmission electron microscope and inspection method using transm...

Charged particle beam device

Charged particle beam apparatus and method for controlling charged...

Charged particle beam apparatus and method of controlling charged p...

Charged particle beam device and control method thereof

Imaging device and morphological feature data display method

Charged particle beam device, method for processing sample, and obs...

Patents Applicationslast 30 patents

Charged Particle Beam System

Analysis System

Transmission Electron Microscope and Inspection Method Using Transm...

Charged Particle Beam Device

CHARGED PARTICLE BEAM APPARATUS AND METHOD FOR CONTROLLING CHARGED...

CHARGED PARTICLE BEAM APPARATUS AND METHOD OF CONTROLLING CHARGED P...

CHARGED PARTICLE BEAM DEVICE AND CONTROL METHOD THEREOF

Charged Particle Beam Device, Method for Processing Sample, and Obs...

Imaging Device and Morphological Feature Data Display Method

Charged Particle Beam Apparatus and Cell Evaluation Method