Hiromi Okada

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Hyogo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus of precisely measuring intensity profile of X-...
- Patent number 8,744,046
- Issue date Jun 3, 2014
- JTEC Corporation
- Kazuto Yamauchi
- G01 - MEASURING TESTING
Information Patent Grant
High precision posture control method of X-ray mirror
- Patent number 8,000,443
- Issue date Aug 16, 2011
- JTEC Corporation
- Kazuto Yamauchi
- G02 - OPTICS
Information Patent Grant
X-ray condensing method and its device using phase restoration method
- Patent number 7,936,860
- Issue date May 3, 2011
- JTEC Corporation
- Kazuto Yamauchi
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS OF PRECISELY MEASURING INTENSITY PROFILE OF X-...
- Publication number 20110305317
- Publication date Dec 15, 2011
- Kazuto Yamauchi
- G01 - MEASURING TESTING
Information Patent Application
X-RAY CONDENSING METHOD AND ITS DEVICE USING PHASE RESTORATION METHOD
- Publication number 20100183122
- Publication date Jul 22, 2010
- Jtec Corporation
- Kazuto Yamauchi
- G02 - OPTICS
Information Patent Application
HIGH PRECISION POSTURE CONTROL METHOD OF X-RAY MIRROR
- Publication number 20100002838
- Publication date Jan 7, 2010
- Kazuto Yamauchi
- G02 - OPTICS