Hiromi Onomichi

Person

Kobe-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Smear transporting apparatus, smear system, and smear preparing app...
- Patent number 11,506,578
- Issue date Nov 22, 2022
- Sysmex Corporation
- Takayuki Nakajima
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Sample processing apparatus and sample processing method
- Patent number 9,329,193
- Issue date May 3, 2016
- Sysmex Corporation
- Hiromi Onomichi
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for checking measurement result
- Patent number 8,008,089
- Issue date Aug 30, 2011
- Sysmex Corporation
- Masakazu Fukuda
- G01 - MEASURING TESTING
Information Patent Grant
Analyzer and computer program product
- Patent number 7,395,172
- Issue date Jul 1, 2008
- Sysmex Corporation
- Hiromi Onomichi
- G01 - MEASURING TESTING
Information Patent Grant
Analyzer and computer program product
- Patent number 7,174,266
- Issue date Feb 6, 2007
- Sysmex Corporation
- Hiromi Onomichi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SMEAR TRANSPORTING APPARATUS, SMEAR SYSTEM, AND SMEAR PREPARING APP...
- Publication number 20230075319
- Publication date Mar 9, 2023
- SYSMEX CORPORATION
- Takayuki NAKAJIMA
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
SMEAR TRANSPORTING APPARATUS, SMEAR SYSTEM, AND SMEAR PREPARING APP...
- Publication number 20180031454
- Publication date Feb 1, 2018
- SYSMEX CORPORATION
- Takayuki NAKAJIMA
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
SAMPLE PROCESSING APPARATUS AND SAMPLE PROCESSING METHOD
- Publication number 20120064638
- Publication date Mar 15, 2012
- SYSMEX CORPORATION
- Hiromi ONOMICHI
- G01 - MEASURING TESTING
Information Patent Application
Analyzer
- Publication number 20080033580
- Publication date Feb 7, 2008
- Sysmex Corporation
- Takamichi Naito
- G01 - MEASURING TESTING
Information Patent Application
ANALYZER AND COMPUTER PROGRAM PRODUCT
- Publication number 20070124099
- Publication date May 31, 2007
- SYSMEX CORPORATION
- Hiromi Onomichi
- G01 - MEASURING TESTING
Information Patent Application
Method for checking measurement result, system for checking measure...
- Publication number 20070072301
- Publication date Mar 29, 2007
- Sysmex Corporation
- Masakazu Fukuda
- G01 - MEASURING TESTING
Information Patent Application
Analyzer and computer program product
- Publication number 20060064270
- Publication date Mar 23, 2006
- Sysmex Corporation
- Hiromi Onomichi
- G01 - MEASURING TESTING
Information Patent Application
Analyzer
- Publication number 20040033164
- Publication date Feb 19, 2004
- Sysmex Corporation
- Takamichi Naito
- G01 - MEASURING TESTING

Hiromi Onomichi

Person

Patents Grantslast 30 patents

Smear transporting apparatus, smear system, and smear preparing app...

Sample processing apparatus and sample processing method

Method and system for checking measurement result

Analyzer and computer program product

Analyzer and computer program product

Patents Applicationslast 30 patents

SMEAR TRANSPORTING APPARATUS, SMEAR SYSTEM, AND SMEAR PREPARING APP...

SMEAR TRANSPORTING APPARATUS, SMEAR SYSTEM, AND SMEAR PREPARING APP...

SAMPLE PROCESSING APPARATUS AND SAMPLE PROCESSING METHOD

Analyzer

ANALYZER AND COMPUTER PROGRAM PRODUCT

Method for checking measurement result, system for checking measure...

Analyzer and computer program product

Analyzer