Hiromi Oshima

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Tester hardware
- Patent number 9,140,752
- Issue date Sep 22, 2015
- Advantest Corporation
- Hiromi Oshima
- G11 - INFORMATION STORAGE
Information Patent Grant
Test apparatus and test method
- Patent number 8,981,786
- Issue date Mar 17, 2015
- Advantest Corporation
- Hiromi Oshima
- G11 - INFORMATION STORAGE
Information Patent Grant
Test apparatus and test method
- Patent number 8,898,531
- Issue date Nov 25, 2014
- Advantest Corporation
- Hiromi Oshima
- G11 - INFORMATION STORAGE
Information Patent Grant
Test apparatus and test method
- Patent number 8,718,123
- Issue date May 6, 2014
- Advantest Corporation
- Kazumichi Yoshiba
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory testing method and memory testing apparatus
- Patent number 6,877,118
- Issue date Apr 5, 2005
- Advantest Corporation
- Hiromi Oshima
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device testing apparatus and data selection circuit
- Patent number 6,490,700
- Issue date Dec 3, 2002
- Advantest Corporation
- Hiromi Oshima
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory tester
- Patent number 6,158,037
- Issue date Dec 5, 2000
- Advantest Corporation
- Hiromi Oshima
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory fail analysis device in semiconductor memory test system
- Patent number 5,914,964
- Issue date Jun 22, 1999
- Advantest Corp.
- Takashi Saito
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory test system
- Patent number 5,757,815
- Issue date May 26, 1998
- Advantest Corp.
- Kazushige Shimogama
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
TESTER HARDWARE
- Publication number 20130326299
- Publication date Dec 5, 2013
- Hiromi Oshima
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20120331346
- Publication date Dec 27, 2012
- Advantest Corporation
- Hiromi OSHIMA
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20120300826
- Publication date Nov 29, 2012
- Advantest Corporation
- Kazumichi YOSHIBA
- G11 - INFORMATION STORAGE
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20120299600
- Publication date Nov 29, 2012
- Advantest Corporation
- Hiromi OSHIMA
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20120304009
- Publication date Nov 29, 2012
- Advantest Corporation
- Hiromi OSHIMA
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20120299606
- Publication date Nov 29, 2012
- Advantest Corporation
- Hiromi OSHIMA
- G11 - INFORMATION STORAGE
Information Patent Application
Memory testing method and memory testing apparatus
- Publication number 20010052093
- Publication date Dec 13, 2001
- Japan Aviation Electronics Industry Limited
- Hiromi Oshima
- G11 - INFORMATION STORAGE

Hiromi Oshima

Person

Patents Grantslast 30 patents

Tester hardware

Test apparatus and test method

Test apparatus and test method

Test apparatus and test method

Memory testing method and memory testing apparatus

Memory device testing apparatus and data selection circuit

Memory tester

Memory fail analysis device in semiconductor memory test system

Semiconductor memory test system

Patents Applicationslast 30 patents

TESTER HARDWARE

TEST APPARATUS AND TEST METHOD

TEST APPARATUS AND TEST METHOD

TEST APPARATUS AND TEST METHOD

TEST APPARATUS AND TEST METHOD

TEST APPARATUS AND TEST METHOD

Memory testing method and memory testing apparatus