TREA

Hiromi SATOU

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Particle analyzing device
    • Patent number 9,423,388
    • Issue date Aug 23, 2016
    • Hitachi, Ltd.
    • Koichi Terada
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Particle Analyzing Device
    • Publication number 20150377851
    • Publication date Dec 31, 2015
    • Hitachi, Ltd
    • Koichi TERADA
    • G01 - MEASURING TESTING