Hiromi Tsuchida

Follow

Person

Kyoto, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Testing method of semiconductor integrated circuit and information...
- Patent number 7,719,301
- Issue date May 18, 2010
- Panasonic Corporation
- Hiromi Tsuchida
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTING METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT AND INFORMATION...
- Publication number 20090237104
- Publication date Sep 24, 2009
- Hiromi Tsuchida
- G01 - MEASURING TESTING