Hiromi Yamazaki

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Hitachiota, JP

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Patents Grantslast 30 patents

Information Patent Grant
Foreign matter inspection device and foreign matter inspection method
- Patent number 9,710,731
- Issue date Jul 18, 2017
- Hitachi Information & Control Solutions, Ltd.
- Hirohisa Fukuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection device and system for inspecting foreign matters in a li...
- Patent number 6,937,339
- Issue date Aug 30, 2005
- Hitachi Engineering Co., Ltd.
- Hiromi Yamazaki
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device for body to be inspected and inspection device of...
- Patent number 6,882,422
- Issue date Apr 19, 2005
- Hitachi Engineering Co. Ltd.
- Tadahiro Katane
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Foreign Matter Inspection Device and Foreign Matter Inspection Method
- Publication number 20130070084
- Publication date Mar 21, 2013
- Hitachi Information & Control Solutions, Ltd.
- Hirohisa Fukuda
- G01 - MEASURING TESTING
Information Patent Application
Inspection device for body to be inspected and inspection device of...
- Publication number 20030063281
- Publication date Apr 3, 2003
- Tadahiro Katane
- G01 - MEASURING TESTING
Information Patent Application
Inspection device and system for inspecting foreign matters in liqu...
- Publication number 20020171054
- Publication date Nov 21, 2002
- Hiromi Yamazaki
- G01 - MEASURING TESTING