Hiromichi Kumakura

Person

Niiza-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and method for manufacturing the semiconductor...
- Patent number 10,297,557
- Issue date May 21, 2019
- Sanken Electric Co., Ltd.
- Hiroshi Shikauchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for forming the semiconductor device
- Patent number 10,186,586
- Issue date Jan 22, 2019
- Sanken Electric Co., Ltd.
- Hiroko Kawaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing the semiconductor...
- Patent number 10,158,013
- Issue date Dec 18, 2018
- Sanken Electric Co., Ltd.
- Hiroshi Shikauchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 10,020,373
- Issue date Jul 10, 2018
- Sanken Electric Co., Ltd.
- Hiromichi Kumakura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 9,941,124
- Issue date Apr 10, 2018
- Sanken Electric Co., Ltd.
- Hiromichi Kumakura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 9,391,136
- Issue date Jul 12, 2016
- Sanken Electric Co., Ltd.
- Hiroko Kawaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 9,130,063
- Issue date Sep 8, 2015
- Sanken Electric Co., Ltd.
- Hiroko Kawaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having hall-effect and manufacturing method th...
- Patent number 7,067,923
- Issue date Jun 27, 2006
- Sanken Electric Co., Ltd.
- Hiromichi Kumakura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hall-effect current detector
- Patent number 6,781,358
- Issue date Aug 24, 2004
- Sanken Electric Co., Ltd.
- Hirokazu Goto
- G01 - MEASURING TESTING
Information Patent Grant
Hall-effect current detector
- Patent number 6,759,841
- Issue date Jul 6, 2004
- Sanken Electric Co., Ltd.
- Hirokazu Goto
- G01 - MEASURING TESTING
Information Patent Grant
Current detector utilizing hall effect
- Patent number 6,545,457
- Issue date Apr 8, 2003
- Sanken Electric Co., Ltd.
- Hirokazu Goto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor Device and Method for Manufacturing the Semiconductor...
- Publication number 20190035899
- Publication date Jan 31, 2019
- Sanken Electric Co., Ltd.
- Hiroko KAWAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device and Method for Manufacturing the Semiconductor...
- Publication number 20190006292
- Publication date Jan 3, 2019
- Sanken Electric Co., Ltd.
- Hiroshi SHIKAUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device and Method for Manufacturing the Semiconductor...
- Publication number 20180350982
- Publication date Dec 6, 2018
- Sanken Electric Co., Ltd.
- Hiroshi SHIKAUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device and Method of Manufacturing the Same
- Publication number 20150091022
- Publication date Apr 2, 2015
- Sanken Electric Co., Ltd
- Hiroko Kawaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MODULE DESIGN METHOD AND SEMICONDUCTOR MODULE
- Publication number 20120079446
- Publication date Mar 29, 2012
- Hiromichi KUMAKURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and manufacturing method thereof
- Publication number 20040110367
- Publication date Jun 10, 2004
- Hiromichi Kumakura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Hall-effect current detector
- Publication number 20030006751
- Publication date Jan 9, 2003
- Sanken Electric Co. Ltd.
- Hirokazu Goto
- G01 - MEASURING TESTING
Information Patent Application
Hall-effect current detector
- Publication number 20030001559
- Publication date Jan 2, 2003
- Sanken Electric Co., Ltd.
- Hirokazu Goto
- G01 - MEASURING TESTING
Information Patent Application
Hall-effect magnetoelectric converter
- Publication number 20020011841
- Publication date Jan 31, 2002
- Sanken Electric Co., Ltd.
- Hirokazu Goto
- G01 - MEASURING TESTING

Hiromichi Kumakura

Person

Patents Grantslast 30 patents

Semiconductor device and method for manufacturing the semiconductor...

Semiconductor device and method for forming the semiconductor device

Semiconductor device and method for manufacturing the semiconductor...

Semiconductor device

Semiconductor device

Semiconductor device

Semiconductor device and method of manufacturing the same

Semiconductor device having hall-effect and manufacturing method th...

Hall-effect current detector

Hall-effect current detector

Current detector utilizing hall effect

Patents Applicationslast 30 patents

Semiconductor Device and Method for Manufacturing the Semiconductor...

Semiconductor Device and Method for Manufacturing the Semiconductor...

Semiconductor Device and Method for Manufacturing the Semiconductor...

Semiconductor Device and Method of Manufacturing the Same

SEMICONDUCTOR MODULE DESIGN METHOD AND SEMICONDUCTOR MODULE

Semiconductor device and manufacturing method thereof

Hall-effect current detector

Hall-effect current detector

Hall-effect magnetoelectric converter