Hiromitsu HORINO

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Saitama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Electronic component handling apparatus and electronic component te...
- Patent number 11,714,124
- Issue date Aug 1, 2023
- Advantest Corporation
- Hiromitsu Horino
- G01 - MEASURING TESTING
Information Patent Grant
Handler apparatus that conveys a device under test to a test socket...
- Patent number 9,784,789
- Issue date Oct 10, 2017
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Handler apparatus, adjustment method of handler apparatus, and test...
- Patent number 9,658,287
- Issue date May 23, 2017
- Advantest Corporation
- Tsuyoshi Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Handler apparatus that conveys a device under test to a test socket...
- Patent number 9,606,170
- Issue date Mar 28, 2017
- Advantest Corporation
- Tsuyoshi Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Handler and test apparatus
- Patent number 9,316,686
- Issue date Apr 19, 2016
- Advantest Corporation
- Hiromitsu Horino
- G01 - MEASURING TESTING
Information Patent Grant
Handler for conveying a plurality of devices under test to a socket...
- Patent number 9,024,648
- Issue date May 5, 2015
- Advantest Corporation
- Hiromitsu Horino
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC COMPONENT HANDLING APPARATUS AND ELECTRONIC COMPONENT TE...
- Publication number 20220026486
- Publication date Jan 27, 2022
- Advantest Corporation
- Hiromitsu Horino
- G01 - MEASURING TESTING
Information Patent Application
Handler Apparatus and Test Apparatus
- Publication number 20150276863
- Publication date Oct 1, 2015
- Advantest Corporation
- Tsuyoshi YAMASHITA
- G01 - MEASURING TESTING
Information Patent Application
Handler Apparatus and Test Apparatus
- Publication number 20150276862
- Publication date Oct 1, 2015
- Advantest Corporation
- Aritomo KIKUCHI
- G01 - MEASURING TESTING
Information Patent Application
HANDLER APPARATUS, ADJUSTMENT METHOD OF HANDLER APPARATUS, AND TEST...
- Publication number 20150276861
- Publication date Oct 1, 2015
- Advantest Corporation
- Tsuyoshi YAMASHITA
- G01 - MEASURING TESTING
Information Patent Application
HANDLER AND TEST APPARATUS
- Publication number 20130181734
- Publication date Jul 18, 2013
- Advantest Corporation
- Hiromitsu HORINO
- G01 - MEASURING TESTING
Information Patent Application
HANDLER AND TEST APPARATUS
- Publication number 20130181735
- Publication date Jul 18, 2013
- Advantest Corporation
- Hiromitsu HORINO
- G01 - MEASURING TESTING