Hiromitsu Sugimoto

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Hyogo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Substrate testing apparatus and substrate testing method
- Patent number 6,747,466
- Issue date Jun 8, 2004
- Renesas Technology Corp.
- Hiromitsu Sugimoto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Substrate Testing apparatus and substrate testing method
- Publication number 20020190736
- Publication date Dec 19, 2002
- MITSUBISHI DENKI KABUSHIKI KAISHA, RYODEN SEMICONDUCTOR SYSTEM ENGINEERING CO...
- Hiromitsu Sugimoto
- G01 - MEASURING TESTING
Information Patent Application
Burn-in system and burn-in method
- Publication number 20020009120
- Publication date Jan 24, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Hiromitsu Sugimoto
- G01 - MEASURING TESTING