Hiromu Inoue

Person

Kanagawa-ken, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Pattern inspection device and pattern inspection method
- Patent number 12,205,272
- Issue date Jan 21, 2025
- NuFlare Technology, Inc.
- Hiromu Inoue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,385,192
- Issue date Jul 12, 2022
- NuFlare Technology, Inc.
- Masataka Shiratsuchi
- G01 - MEASURING TESTING
Information Patent Grant
Multiple electron beam inspection apparatus and multiple electron b...
- Patent number 11,101,103
- Issue date Aug 24, 2021
- NuFlare Technology, Inc.
- Masataka Shiratsuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple electron beam inspection apparatus and multiple electron b...
- Patent number 10,984,978
- Issue date Apr 20, 2021
- NuFlare Technology, Inc.
- Hiromu Inoue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection method and inspection apparatus
- Patent number 10,572,995
- Issue date Feb 25, 2020
- NuFlare Technology, Inc.
- Hiromu Inoue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vehicular door structure
- Patent number 10,232,689
- Issue date Mar 19, 2019
- Honda Motor Co., Ltd.
- Satoshi Endo
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Inspection apparatus
- Patent number 10,197,507
- Issue date Feb 5, 2019
- NuFlare Technology, Inc.
- Riki Ogawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Pattern characteristic-detection apparatus for photomask and patter...
- Patent number 9,841,385
- Issue date Dec 12, 2017
- Kabushiki Kaisha Toshiba
- Hiromu Inoue
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Vehicle door
- Patent number 9,764,625
- Issue date Sep 19, 2017
- Honda Motor Co., Ltd.
- Satoshi Endo
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Inspection apparatus and inspection apparatus system
- Patent number 9,691,143
- Issue date Jun 27, 2017
- NuFlare Technology, Inc.
- Hiromu Inoue
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Position measuring method, misplacement map generating method, and...
- Patent number 9,645,488
- Issue date May 9, 2017
- NuFlare Technology, Inc.
- Hiromu Inoue
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 9,557,277
- Issue date Jan 31, 2017
- NuFlare Technology, Inc.
- Hiromu Inoue
- G01 - MEASURING TESTING
Information Patent Grant
Door sash
- Patent number 9,539,884
- Issue date Jan 10, 2017
- Honda Motor Co., Ltd.
- Satoshi Endo
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Defect inspection apparatus using images obtained by optical path a...
- Patent number 9,460,502
- Issue date Oct 4, 2016
- Kabushiki Kaisha Toshiba
- Hiromu Inoue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection system and method for inspecting line width and/or posit...
- Patent number 9,406,117
- Issue date Aug 2, 2016
- NuFlare Technology, Inc.
- Takanao Touya
- G01 - MEASURING TESTING
Information Patent Grant
Sample support apparatus
- Patent number 9,207,189
- Issue date Dec 8, 2015
- NuFlare Technology, Inc.
- Riki Ogawa
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection method
- Patent number 9,194,817
- Issue date Nov 24, 2015
- Nuflare Technology, Inc.
- Shinji Sugihara
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and system
- Patent number 9,116,136
- Issue date Aug 25, 2015
- NuFlare Technology, Inc.
- Hiromu Inoue
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and method for inspecting line width and/or posit...
- Patent number 9,036,896
- Issue date May 19, 2015
- Nuflare Technology, Inc.
- Takanao Touya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection apparatus
- Patent number 8,761,518
- Issue date Jun 24, 2014
- Kabushiki Kaisha Toshiba
- Hiromu Inoue
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection device and method of inspecting pattern
- Patent number 8,358,340
- Issue date Jan 22, 2013
- Kabushiki Kaisha Toshiba
- Ryoji Yoshikawa
- G01 - MEASURING TESTING
Information Patent Grant
Size checking method and apparatus
- Patent number 7,466,854
- Issue date Dec 16, 2008
- Kabushiki Kaisha Toshiba
- Eiji Sawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Focusing device, focusing method and a pattern inspecting apparatus
- Patent number 7,394,048
- Issue date Jul 1, 2008
- Kabushiki Kaisha Toshiba
- Hiromu Inoue
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for repairing a photomask, method for inspecting a photomask...
- Patent number 7,378,201
- Issue date May 27, 2008
- Kabushiki Kaisha Toshiba
- Katsuki Ohashi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus having two sensors, method for inspecting an o...
- Patent number 7,304,730
- Issue date Dec 4, 2007
- Kabushiki Kaisha Toshiba
- Hiromu Inoue
- G01 - MEASURING TESTING
Information Patent Grant
Method for repairing a photomask, method for inspecting a photomask...
- Patent number 7,070,889
- Issue date Jul 4, 2006
- Kabushiki Kaisha Toshiba
- Katsuki Ohashi
- G01 - MEASURING TESTING
Information Patent Grant
Size checking method and apparatus
- Patent number 6,965,687
- Issue date Nov 15, 2005
- Kabushiki Kaisha Toshiba
- Eiji Sawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for inspecting patterns
- Patent number 6,888,958
- Issue date May 3, 2005
- Kabushiki Kaisha Toshiba
- Eiji Sawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for repairing a photomask, method for inspecting a photomask...
- Patent number 6,849,363
- Issue date Feb 1, 2005
- Kabushiki Kaisha Toshiba
- Katsuki Ohashi
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection apparatus, pattern inspection method and mask ma...
- Patent number 6,656,648
- Issue date Dec 2, 2003
- Kabushiki Kaisha Toshiba
- Hiromu Inoue
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION APPARATUS, INSPECTION METHOD, AND STORAGE MEDIUM
- Publication number 20240046449
- Publication date Feb 8, 2024
- Kabushiki Kaisha Toshiba
- Takashi Watanabe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-ELECTRON BEAM INSPECTION DEVICE AND MULTI-ELECTRON BEAM INSPE...
- Publication number 20230170183
- Publication date Jun 1, 2023
- NuFlare Technology, Inc.
- Riki OGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
- Publication number 20230018318
- Publication date Jan 19, 2023
- NuFlare Technology, Inc.
- Ryoichi HIRANO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION DEVICE AND PATTERN INSPECTION METHOD
- Publication number 20220301138
- Publication date Sep 22, 2022
- NuFlare Technology, Inc.
- Hiromu INOUE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20210010959
- Publication date Jan 14, 2021
- NuFlare Technology, Inc.
- Masataka SHIRATSUCHI
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE ELECTRON BEAM INSPECTION APPARATUS AND MULTIPLE ELECTRON B...
- Publication number 20200286709
- Publication date Sep 10, 2020
- NuFlare Technology, Inc.
- Masataka SHIRATSUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE ELECTRON BEAM INSPECTION APPARATUS AND MULTIPLE ELECTRON B...
- Publication number 20200161082
- Publication date May 21, 2020
- NuFlare Technology, Inc.
- Hiromu INOUE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20180232873
- Publication date Aug 16, 2018
- NuFlare Technology, Inc.
- Hiromu Inoue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VEHICULAR DOOR STRUCTURE
- Publication number 20170113521
- Publication date Apr 27, 2017
- Honda Motor Co., Ltd.
- Satoshi Endo
- B60 - VEHICLES IN GENERAL
Information Patent Application
DOOR HOLE SEAL FOR AUTOMOBILE
- Publication number 20170018916
- Publication date Jan 19, 2017
- Nishikawa Rubber Co., Ltd.
- Yasuhiro ITSUKI
- B60 - VEHICLES IN GENERAL
Information Patent Application
DOOR SASH
- Publication number 20160221422
- Publication date Aug 4, 2016
- Honda Motor Co., Ltd.
- Satoshi Endo
- B60 - VEHICLES IN GENERAL
Information Patent Application
VEHICLE DOOR
- Publication number 20160214468
- Publication date Jul 28, 2016
- Honda Motor Co., Ltd.
- Satoshi Endo
- B60 - VEHICLES IN GENERAL
Information Patent Application
POSITION MEASURING METHOD, MISPLACEMENT MAP GENERATING METHOD, AND...
- Publication number 20160034632
- Publication date Feb 4, 2016
- NuFlare Technology, Inc.
- Hiromu INOUE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR INSPECTING LINE WIDTH AND/OR POSIT...
- Publication number 20150193918
- Publication date Jul 9, 2015
- NuFlare Technology, Inc.
- Takanao Touya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SAMPLE SUPPORT APPARATUS
- Publication number 20140240700
- Publication date Aug 28, 2014
- NuFlare Technology, Inc.
- Riki Ogawa
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS
- Publication number 20140204202
- Publication date Jul 24, 2014
- NuFlare Technology, Inc.
- Riki OGAWA
- B82 - NANO-TECHNOLOGY
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20140111636
- Publication date Apr 24, 2014
- NuFlare Technology, Inc.
- Hiromu Inoue
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION APPARATUS SYSTEM
- Publication number 20140104412
- Publication date Apr 17, 2014
- NuFlare Technology, Inc.
- Hiromu INOUE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT DETECTION METHOD
- Publication number 20140055774
- Publication date Feb 27, 2014
- NuFlare Technology, Inc.
- Shinji SUGIHARA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD AND SYSTEM
- Publication number 20140002826
- Publication date Jan 2, 2014
- Hiromu Inoue
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS
- Publication number 20130242084
- Publication date Sep 19, 2013
- Kabushiki Kaisha Toshiba
- Hiromu INOUE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION APPARATUS
- Publication number 20120020546
- Publication date Jan 26, 2012
- Kabushiki Kaisha Toshiba
- Hiromu Inoue
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR INSPECTING LINE WIDTH AND/OR POSIT...
- Publication number 20110255770
- Publication date Oct 20, 2011
- Kabushiki Kaisha Toshiba
- Takanao Touya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN CHARACTERISTIC-DETECTION APPARATUS FOR PHOTOMASK AND PATTER...
- Publication number 20110058729
- Publication date Mar 10, 2011
- Kabushiki Kaisha Toshiba
- Hiromu Inoue
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION DEVICE AND METHOD OF INSPECTING PATTERN
- Publication number 20090303323
- Publication date Dec 10, 2009
- Ryoji Yoshikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING A PATTERN AND METHOD FOR MANUFA...
- Publication number 20080055606
- Publication date Mar 6, 2008
- Kabushiki Kaisha Toshiba
- Hiromu Inoue
- G01 - MEASURING TESTING
Information Patent Application
Inspection apparatus having two sensors, method for inspecting an o...
- Publication number 20080030719
- Publication date Feb 7, 2008
- Hiromu Inoue
- G01 - MEASURING TESTING
Information Patent Application
FOCUSING DEVICE, FOCUSING METHOD AND A PATTERN INSPECTING APPARATUS
- Publication number 20070200051
- Publication date Aug 30, 2007
- Hiromu Inoue
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method for repairing a photomask, method for inspecting a photomask...
- Publication number 20060257756
- Publication date Nov 16, 2006
- Kabushiki Kaishi Toshiba
- Katsuki Ohashi
- G01 - MEASURING TESTING
Information Patent Application
Size checking method and apparatus
- Publication number 20050265595
- Publication date Dec 1, 2005
- Eiji Sawa
- G06 - COMPUTING CALCULATING COUNTING

Hiromu Inoue

Person

Patents Grantslast 30 patents

Pattern inspection device and pattern inspection method

Inspection apparatus and inspection method

Multiple electron beam inspection apparatus and multiple electron b...

Multiple electron beam inspection apparatus and multiple electron b...

Inspection method and inspection apparatus

Vehicular door structure

Inspection apparatus

Pattern characteristic-detection apparatus for photomask and patter...

Vehicle door

Inspection apparatus and inspection apparatus system

Position measuring method, misplacement map generating method, and...

Inspection apparatus and inspection method

Door sash

Defect inspection apparatus using images obtained by optical path a...

Inspection system and method for inspecting line width and/or posit...

Sample support apparatus

Defect detection method

Inspection method and system

Inspection system and method for inspecting line width and/or posit...

Pattern inspection apparatus

Pattern inspection device and method of inspecting pattern

Size checking method and apparatus

Focusing device, focusing method and a pattern inspecting apparatus

Method for repairing a photomask, method for inspecting a photomask...

Inspection apparatus having two sensors, method for inspecting an o...

Method for repairing a photomask, method for inspecting a photomask...

Size checking method and apparatus

Method and apparatus for inspecting patterns

Method for repairing a photomask, method for inspecting a photomask...

Pattern inspection apparatus, pattern inspection method and mask ma...

Patents Applicationslast 30 patents

INSPECTION APPARATUS, INSPECTION METHOD, AND STORAGE MEDIUM

MULTI-ELECTRON BEAM INSPECTION DEVICE AND MULTI-ELECTRON BEAM INSPE...

PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD

PATTERN INSPECTION DEVICE AND PATTERN INSPECTION METHOD

INSPECTION APPARATUS AND INSPECTION METHOD

MULTIPLE ELECTRON BEAM INSPECTION APPARATUS AND MULTIPLE ELECTRON B...

MULTIPLE ELECTRON BEAM INSPECTION APPARATUS AND MULTIPLE ELECTRON B...

INSPECTION METHOD AND INSPECTION APPARATUS

VEHICULAR DOOR STRUCTURE

DOOR HOLE SEAL FOR AUTOMOBILE

DOOR SASH

VEHICLE DOOR

POSITION MEASURING METHOD, MISPLACEMENT MAP GENERATING METHOD, AND...

INSPECTION SYSTEM AND METHOD FOR INSPECTING LINE WIDTH AND/OR POSIT...

SAMPLE SUPPORT APPARATUS

INSPECTION APPARATUS

INSPECTION APPARATUS AND INSPECTION METHOD

INSPECTION APPARATUS AND INSPECTION APPARATUS SYSTEM

DEFECT DETECTION METHOD

INSPECTION METHOD AND SYSTEM

DEFECT INSPECTION APPARATUS

PATTERN INSPECTION APPARATUS

INSPECTION SYSTEM AND METHOD FOR INSPECTING LINE WIDTH AND/OR POSIT...

PATTERN CHARACTERISTIC-DETECTION APPARATUS FOR PHOTOMASK AND PATTER...

PATTERN INSPECTION DEVICE AND METHOD OF INSPECTING PATTERN

APPARATUS AND METHOD FOR INSPECTING A PATTERN AND METHOD FOR MANUFA...

Inspection apparatus having two sensors, method for inspecting an o...

FOCUSING DEVICE, FOCUSING METHOD AND A PATTERN INSPECTING APPARATUS

Method for repairing a photomask, method for inspecting a photomask...

Size checking method and apparatus