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Hironobu Abe
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Nirasaki-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method for controlling parallelism between probe card and mounting...
Patent number
7,486,089
Issue date
Feb 3, 2009
Tokyo Electron Limited
Hironobu Abe
G01 - MEASURING TESTING
Information
Patent Grant
Probe device, probe card channel information creation program, and...
Patent number
6,963,208
Issue date
Nov 8, 2005
Tokyo Electron Limited
Yukihiko Fukasawa
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method for controlling parallelism between probe card and mounting...
Publication number
20070057683
Publication date
Mar 15, 2007
TOKYO ELECTRON LIMITED
Hironobu Abe
G01 - MEASURING TESTING
Information
Patent Application
Probe device, probe card channel information creation program, and...
Publication number
20050140380
Publication date
Jun 30, 2005
TOKYO ELECTRON LIMITED
Yukihiko Fukasawa
G01 - MEASURING TESTING