Hironobu Taoka

Person

Hyogo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus for evaluating lithography process margin simulating layo...
- Patent number 6,760,892
- Issue date Jul 6, 2004
- Renesas Technology Corp.
- Hironobu Taoka
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for verification of a circuit layout
- Patent number 6,427,225
- Issue date Jul 30, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Osamu Kitada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern distortion detecting method and apparatus and recording med...
- Patent number 6,350,977
- Issue date Feb 26, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Hironobu Taoka
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus and process for pattern distortion detection for semicond...
- Patent number 6,343,370
- Issue date Jan 29, 2002
- Mitsubishi Denki Kabusiki Kaisha
- Hironobu Taoka
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
boundary processing of oblique overlapping graphics to achieve dime...
- Patent number 6,271,852
- Issue date Aug 7, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Kinya Kamiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of producing highly precise charged beam drawing data divide...
- Patent number 6,088,520
- Issue date Jul 11, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Hironobu Taoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged beam pattern data generating method and a charged beam patt...
- Patent number 5,812,412
- Issue date Sep 22, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Koichi Moriizumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam drawing data production apparatus and charged...
- Patent number 5,796,408
- Issue date Aug 18, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Kinya Kamiyama
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE MANUFACTURING METHOD USING DOUBLE PATTERNING A...
- Publication number 20090061362
- Publication date Mar 5, 2009
- RENESAS TECHNOLOGY CORP.
- Hironobu TAOKA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Apparatus for evaluating lithography process margin simulating layo...
- Publication number 20040225993
- Publication date Nov 11, 2004
- Hironobu Taoka
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Apparatus for evaluating lithography process margin simulating layo...
- Publication number 20030154460
- Publication date Aug 14, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Hironobu Taoka
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PATTERN DISTORTION DETECTING METHOD AND APPARATUS AND RECORDING MED...
- Publication number 20010048478
- Publication date Dec 6, 2001
- HIRONOBU TAOKA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Pattern distortion correction device, pattern distortion correction...
- Publication number 20010049811
- Publication date Dec 6, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Hironobu Taoka
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Hironobu Taoka

Person

Patents Grantslast 30 patents

Apparatus for evaluating lithography process margin simulating layo...

Method and apparatus for verification of a circuit layout

Pattern distortion detecting method and apparatus and recording med...

Apparatus and process for pattern distortion detection for semicond...

boundary processing of oblique overlapping graphics to achieve dime...

Method of producing highly precise charged beam drawing data divide...

Charged beam pattern data generating method and a charged beam patt...

Charged particle beam drawing data production apparatus and charged...

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE MANUFACTURING METHOD USING DOUBLE PATTERNING A...

Apparatus for evaluating lithography process margin simulating layo...

Apparatus for evaluating lithography process margin simulating layo...

PATTERN DISTORTION DETECTING METHOD AND APPARATUS AND RECORDING MED...

Pattern distortion correction device, pattern distortion correction...