TREA

Hironori ITABASHI

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Charged particle beam device
    • Patent number 11,424,099
    • Issue date Aug 23, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Hiroki Kannami
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged particle beam apparatus
    • Patent number 10,971,347
    • Issue date Apr 6, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Mitsuhiro Nakamura
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

  • Information Patent Application

    Charged Particle Beam Device and Scan Waveform Generation Method
    • Publication number 20230260739
    • Publication date Aug 17, 2023
    • Hitachi High-Tech Corporation
    • Keisuke TANUMA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Scanning Electron Microscope
    • Publication number 20220415609
    • Publication date Dec 29, 2022
    • Hitachi High-Tech Corporation
    • Takumi UEZONO
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Device
    • Publication number 20210175047
    • Publication date Jun 10, 2021
    • Hitachi High-Tech Corporation
    • Hiroki KANNAMI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CHARGED PARTICLE BEAM APPARATUS
    • Publication number 20210020422
    • Publication date Jan 21, 2021
    • Hitachi High-Technologies Corporation
    • Mitsuhiro NAKAMURA
    • H01 - BASIC ELECTRIC ELEMENTS