Hironori Kasahara

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Patents Grantslast 30 patents

Information Patent Grant
X-ray inspection apparatus and control method
- Patent number 10,054,432
- Issue date Aug 21, 2018
- Omron Corporation
- Hironori Kasahara
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT SYSTEM, INSPECTION SYSTEM, MEASUREMENT DEVICE, MEASUREM...
- Publication number 20240062401
- Publication date Feb 22, 2024
- Omron Corporation
- Takako ONISHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY INSPECTION APPARATUS AND CONTROL METHOD
- Publication number 20180080763
- Publication date Mar 22, 2018
- Omron Corporation
- Hironori KASAHARA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS, X-RAY INSPECTION METHOD, X-RAY INSPECTI...
- Publication number 20110222655
- Publication date Sep 15, 2011
- Omron Corporation
- Kiyoshi Murakami
- G01 - MEASURING TESTING