Hironori Maeda

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TOKYO, JP

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Patents Grantslast 30 patents

Information Patent Grant
Implementing edit and update functionality within a development env...
- Patent number 9,785,542
- Issue date Oct 10, 2017
- Advantest Corporation
- Mark Elston
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Using shared pins in a concurrent test execution environment
- Patent number 9,274,911
- Issue date Mar 1, 2016
- Advantest Corporation
- Mark Elston
- G01 - MEASURING TESTING
Information Patent Grant
Test method and program product used therefor
- Patent number 8,185,339
- Issue date May 22, 2012
- Advantest Corporation
- Hironori Maeda
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test program debugging apparatus
- Patent number 6,725,449
- Issue date Apr 20, 2004
- Advantest Corporation
- Yoshinori Maeda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IMPLEMENTING EDIT AND UPDATE FUNCTIONALITY WITHIN A DEVELOPMENT ENV...
- Publication number 20140310693
- Publication date Oct 16, 2014
- Advantest Corporation
- Mark ELSTON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
USING SHARED PINS IN A CONCURRENT TEST EXECUTION ENVIRONMENT
- Publication number 20140237291
- Publication date Aug 21, 2014
- Advantest Corporation
- Mark Elston
- G01 - MEASURING TESTING
Information Patent Application
TEST METHOD AND PROGRAM PRODUCT USED THEREFOR
- Publication number 20100131224
- Publication date May 27, 2010
- Advantest Corporation
- Hironori Maeda
- G01 - MEASURING TESTING
Information Patent Application
Program development suport device, program execution device, compil...
- Publication number 20060074625
- Publication date Apr 6, 2006
- Advantest Corporation
- Hironori Maeda
- G06 - COMPUTING CALCULATING COUNTING