Hironori SAKURAI

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Patents Grantslast 30 patents

Information Patent Grant
Flaw inspection device and flaw inspection method
- Patent number 10,816,484
- Issue date Oct 27, 2020
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- G05 - CONTROLLING REGULATING
Information Patent Grant
Flaw inspection device and flaw inspection method
- Patent number 10,466,181
- Issue date Nov 5, 2019
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FLAW INSPECTION DEVICE AND FLAW INSPECTION METHOD
- Publication number 20200057003
- Publication date Feb 20, 2020
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20190206047
- Publication date Jul 4, 2019
- Hitachi High-Technologies Corporation
- Toshifumi HONDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FLAW INSPECTION DEVICE AND FLAW INSPECTION METHOD
- Publication number 20190094155
- Publication date Mar 28, 2019
- Hitachi High-Technologies Corporation
- Toshifumi HONDA
- G01 - MEASURING TESTING