Hironori Takahashi

Person

Hamamatsu, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Optical element
- Patent number 11,372,256
- Issue date Jun 28, 2022
- Hamamatsu Photonics K.K.
- Atsushi Nakanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical element for terahertz waves and manufacturing method of the...
- Patent number 11,320,569
- Issue date May 3, 2022
- Hamamatsu Photonics K.K.
- Yoichi Kawada
- G02 - OPTICS
Information Patent Grant
Fermentation state monitoring apparatus and fermentation state moni...
- Patent number 11,293,859
- Issue date Apr 5, 2022
- HAMAMATSU PHOTONICS K.K.
- Kouichiro Akiyama
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz wave spectroscopic measurement apparatus and terahertz wa...
- Patent number 10,895,504
- Issue date Jan 19, 2021
- Hamamatsu Photonics K.K.
- Takashi Yasuda
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement device and optical measurement method
- Patent number 10,809,189
- Issue date Oct 20, 2020
- Hamamatsu Photonics K.K.
- Kazuki Horita
- G01 - MEASURING TESTING
Information Patent Grant
Tunnel current control apparatus and tunnel current control method
- Patent number 10,591,509
- Issue date Mar 17, 2020
- Hamamatsu Photonics K.K.
- Yoichi Kawada
- G01 - MEASURING TESTING
Information Patent Grant
Tunnel current control apparatus and tunnel current control method
- Patent number 10,451,651
- Issue date Oct 22, 2019
- Hamamatsu Photonics K.K.
- Yoichi Kawada
- G01 - MEASURING TESTING
Information Patent Grant
THz bolometer detector
- Patent number 10,393,649
- Issue date Aug 27, 2019
- Hamamatsu Photonics K.K.
- Ryusuke Kitaura
- G01 - MEASURING TESTING
Information Patent Grant
Non-linear optical crystal and method for manufacturing same, and t...
- Patent number 10,248,003
- Issue date Apr 2, 2019
- Hamamatsu Photonics K.K.
- Kouichiro Akiyama
- C07 - ORGANIC CHEMISTRY
Information Patent Grant
Wavelength conversion element and wavelength conversion light pulse...
- Patent number 10,082,720
- Issue date Sep 25, 2018
- Hamamatsu Photonics K.K.
- Hisanari Takahashi
- G02 - OPTICS
Information Patent Grant
Terahertz-wave spectrometer
- Patent number 9,696,206
- Issue date Jul 4, 2017
- Hamamatsu Photonics K.K.
- Takashi Yasuda
- G01 - MEASURING TESTING
Information Patent Grant
Electric field vector detection method and electric field vector de...
- Patent number 9,612,153
- Issue date Apr 4, 2017
- Hamamatsu Photonics K.K.
- Yoichi Kawada
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz-wave spectrometer and prism member
- Patent number 9,080,913
- Issue date Jul 14, 2015
- Hamamatsu Photonics K.K.
- Takashi Yasuda
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic wave detection device
- Patent number 8,993,967
- Issue date Mar 31, 2015
- Hamamatsu Photonics K.K.
- Yoichi Kawada
- G01 - MEASURING TESTING
Information Patent Grant
Optical amplifying device
- Patent number 8,947,771
- Issue date Feb 3, 2015
- Hamamatsu Photonics K.K.
- Koei Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Single terahertz wave time-waveform measuring device
- Patent number 8,742,353
- Issue date Jun 3, 2014
- Hamamatsu Photonics K.K.
- Yoichi Kawada
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz wave generation device
- Patent number 8,564,875
- Issue date Oct 22, 2013
- Hamamatsu Photonics K.K.
- Yoichi Kawada
- G02 - OPTICS
Information Patent Grant
Total reflection terahertz wave measurement device
- Patent number 8,415,625
- Issue date Apr 9, 2013
- Hamamatsu Photonics K.K.
- Atsushi Nakanishi
- G01 - MEASURING TESTING
Information Patent Grant
Total reflection tera hertz wave measuring apparatus
- Patent number 8,354,644
- Issue date Jan 15, 2013
- Hamamatsu Photonics K.K.
- Takashi Yasuda
- G01 - MEASURING TESTING
Information Patent Grant
Fast particle generating apparatus
- Patent number 7,460,228
- Issue date Dec 2, 2008
- Japan Science and Technology Agency
- Hironori Takahashi
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method for generating high-speed particle and system for generating...
- Patent number 7,189,976
- Issue date Mar 13, 2007
- Hamamatsu Photonics K.K.
- Hironori Takahashi
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Terahertz wave spectrometer
- Patent number 6,747,736
- Issue date Jun 8, 2004
- Hamamatsu Photonics K.K.
- Hironori Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Electric field measuring apparatus
- Patent number 5,896,035
- Issue date Apr 20, 1999
- Hamamatsu Photonics K.K.
- Hironori Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Low jitter trigger circuit for electro-optic probing apparatus
- Patent number 5,847,570
- Issue date Dec 8, 1998
- Hamamatsu Photonics K.K.
- Hironori Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic voltage measurement apparatus
- Patent number 5,767,688
- Issue date Jun 16, 1998
- Hamamatsu Photonics K.K.
- Hironori Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Optical delay apparatus
- Patent number 5,751,419
- Issue date May 12, 1998
- Hamamatsu Photonics K.K.
- Hironori Takahashi
- G02 - OPTICS
Information Patent Grant
Voltage detection apparatus
- Patent number 5,703,491
- Issue date Dec 30, 1997
- Hamamatsu Photonics K.K.
- Takuya Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Voltage measuring using electro-optic material's change in refracti...
- Patent number 5,666,062
- Issue date Sep 9, 1997
- Hamamatsu Photonics K.K.
- Hironori Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Electrooptic probe for measuring voltage of an object having a high...
- Patent number 5,642,040
- Issue date Jun 24, 1997
- Hamamatsu Photonics K.K.
- Hironori Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Voltage measurement system
- Patent number 5,631,555
- Issue date May 20, 1997
- Hamamatsu Photonics K.K.
- Hironori Takahashi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR PRODUCTION METHOD AND WAFER INSPECTION METHOD
- Publication number 20200258794
- Publication date Aug 13, 2020
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL ELEMENT
- Publication number 20200249488
- Publication date Aug 6, 2020
- HAMAMATSU PHOTONICS K. K.
- Atsushi NAKANISHI
- G02 - OPTICS
Information Patent Application
SEMICONDUCTOR WAFER
- Publication number 20200176339
- Publication date Jun 4, 2020
- Hamamatsu Photonics K.K.
- Motohiro SUYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FERMENTATION STATE MONITORING APPARATUS AND FERMENTATION STATE MONI...
- Publication number 20200173916
- Publication date Jun 4, 2020
- HAMAMATSU PHOTONICS K. K.
- Kouichiro AKIYAMA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER
- Publication number 20200174074
- Publication date Jun 4, 2020
- Hamamatsu Photonics K.K.
- Motohiro SUYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL ELEMENT FOR TERAHERTZ WAVES AND MANUFACTURING METHOD OF THE...
- Publication number 20200103557
- Publication date Apr 2, 2020
- HAMAMATSU PHOTONICS K. K.
- Yoichi KAWADA
- G02 - OPTICS
Information Patent Application
OPTICAL MEASUREMENT DEVICE AND OPTICAL MEASUREMENT METHOD
- Publication number 20190271642
- Publication date Sep 5, 2019
- HAMAMATSU PHOTONICS K. K.
- Kazuki HORITA
- G01 - MEASURING TESTING
Information Patent Application
TUNNEL CURRENT CONTROL APPARATUS AND TUNNEL CURRENT CONTROL METHOD
- Publication number 20190064209
- Publication date Feb 28, 2019
- HAMAMATSU PHOTONICS K. K.
- Yoichi KAWADA
- G01 - MEASURING TESTING
Information Patent Application
TUNNEL CURRENT CONTROL APPARATUS AND TUNNEL CURRENT CONTROL METHOD
- Publication number 20190064210
- Publication date Feb 28, 2019
- HAMAMATSU PHOTONICS K. K.
- Yoichi KAWADA
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ WAVE SPECTROSCOPIC MEASUREMENT APPARATUS AND TERAHERTZ WA...
- Publication number 20190025124
- Publication date Jan 24, 2019
- HAMAMATSU PHOTONICS K. K.
- Takashi YASUDA
- G01 - MEASURING TESTING
Information Patent Application
THz BOLOMETER DETECTOR
- Publication number 20180266945
- Publication date Sep 20, 2018
- Hamamatsu Photonics K.K.
- Ryusuke KITAURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAVELENGTH CONVERSION ELEMENT AND WAVELENGTH CONVERSION LIGHT PULSE...
- Publication number 20180067376
- Publication date Mar 8, 2018
- HAMAMATSU PHOTONICS K. K.
- Hisanari TAKAHASHI
- G02 - OPTICS
Information Patent Application
NON-LINEAR OPTICAL CRYSTAL AND METHOD FOR MANUFACTURING SAME, AND T...
- Publication number 20170248833
- Publication date Aug 31, 2017
- Hamamatsu Photonics K.K.
- Kouichiro Akiyama
- G02 - OPTICS
Information Patent Application
ELECTRIC FIELD VECTOR DETECTION METHOD AND ELECTRIC FIELD VECTOR DE...
- Publication number 20160146666
- Publication date May 26, 2016
- HAMAMATSU PHOTONICS K. K.
- Yoichi KAWADA
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ-WAVE SPECTROMETER
- Publication number 20140014840
- Publication date Jan 16, 2014
- Hamamatsu Photonics K.K.
- Takashi Yasuda
- G01 - MEASURING TESTING
Information Patent Application
TOTAL REFLECTION SPECTROSCOPIC MEASUREMENT METHOD
- Publication number 20140008541
- Publication date Jan 9, 2014
- Hamamatsu Photonics K.K.
- Kouichiro Akiyama
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ-WAVE SPECTROMETER AND PRISM MEMBER
- Publication number 20140008540
- Publication date Jan 9, 2014
- Hamamatsu Photonics K.K.
- Takashi Yasuda
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC WAVE DETECTION DEVICE
- Publication number 20120326041
- Publication date Dec 27, 2012
- Hamamatsu Photonics K.K.
- Yoichi Kawada
- G01 - MEASURING TESTING
Information Patent Application
TOTAL REFLECTION TERAHERTZ WAVE MEASUREMENT DEVICE
- Publication number 20110249253
- Publication date Oct 13, 2011
- HAMAMATSU PHOTONICS K. K.
- Atsushi Nakanishi
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ WAVE GENERATION DEVICE
- Publication number 20110242642
- Publication date Oct 6, 2011
- HAMAMATSU PHOTONICS K. K.
- Yoichi Kawada
- G02 - OPTICS
Information Patent Application
OPTICAL ELEMENT, LASER BEAM OSCILLATION DEVICE AND LASER BEAM AMPLI...
- Publication number 20110222289
- Publication date Sep 15, 2011
- National Institute of Advanced Industrial Science and Technology
- Koei Yamamoto
- G02 - OPTICS
Information Patent Application
OPTICAL AMPLIFYING DEVICE
- Publication number 20100091359
- Publication date Apr 15, 2010
- Koei Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SINGLE TERAHERTZ WAVE TIME-WAVEFORM MEASURING DEVICE
- Publication number 20100090112
- Publication date Apr 15, 2010
- HAMAMATSU PHOTONICS K.K.
- Yoichi Kawada
- G01 - MEASURING TESTING
Information Patent Application
TOTAL REFLECTION TERA HERTZ WAVE MEASURING APPARATUS
- Publication number 20100091266
- Publication date Apr 15, 2010
- Hamamatsu Photonics K.K.
- Takashi Yasuda
- G01 - MEASURING TESTING
Information Patent Application
Fast particle generating apparatus
- Publication number 20070176078
- Publication date Aug 2, 2007
- Hironori Takahashi
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Target for generating deuteron and target apparatus for generating...
- Publication number 20060039520
- Publication date Feb 23, 2006
- Hironori Takahashi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Method for generating high-speed particle and system for generating...
- Publication number 20060013269
- Publication date Jan 19, 2006
- Hironori Takahashi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Terahertz wave spectrometer
- Publication number 20020067480
- Publication date Jun 6, 2002
- HAMAMATSU PHOTONICS K. K.
- Hironori Takahashi
- G01 - MEASURING TESTING

Hironori Takahashi

Person

Patents Grantslast 30 patents

Optical element

Optical element for terahertz waves and manufacturing method of the...

Fermentation state monitoring apparatus and fermentation state moni...

Terahertz wave spectroscopic measurement apparatus and terahertz wa...

Optical measurement device and optical measurement method

Tunnel current control apparatus and tunnel current control method

Tunnel current control apparatus and tunnel current control method

THz bolometer detector

Non-linear optical crystal and method for manufacturing same, and t...

Wavelength conversion element and wavelength conversion light pulse...

Terahertz-wave spectrometer

Electric field vector detection method and electric field vector de...

Terahertz-wave spectrometer and prism member

Electromagnetic wave detection device

Optical amplifying device

Single terahertz wave time-waveform measuring device

Terahertz wave generation device

Total reflection terahertz wave measurement device

Total reflection tera hertz wave measuring apparatus

Fast particle generating apparatus

Method for generating high-speed particle and system for generating...

Terahertz wave spectrometer

Electric field measuring apparatus

Low jitter trigger circuit for electro-optic probing apparatus

Electro-optic voltage measurement apparatus

Optical delay apparatus

Voltage detection apparatus

Voltage measuring using electro-optic material's change in refracti...

Electrooptic probe for measuring voltage of an object having a high...

Voltage measurement system

Patents Applicationslast 30 patents

SEMICONDUCTOR PRODUCTION METHOD AND WAFER INSPECTION METHOD

OPTICAL ELEMENT

SEMICONDUCTOR WAFER

FERMENTATION STATE MONITORING APPARATUS AND FERMENTATION STATE MONI...

SEMICONDUCTOR WAFER

OPTICAL ELEMENT FOR TERAHERTZ WAVES AND MANUFACTURING METHOD OF THE...

OPTICAL MEASUREMENT DEVICE AND OPTICAL MEASUREMENT METHOD

TUNNEL CURRENT CONTROL APPARATUS AND TUNNEL CURRENT CONTROL METHOD

TUNNEL CURRENT CONTROL APPARATUS AND TUNNEL CURRENT CONTROL METHOD

TERAHERTZ WAVE SPECTROSCOPIC MEASUREMENT APPARATUS AND TERAHERTZ WA...

THz BOLOMETER DETECTOR

WAVELENGTH CONVERSION ELEMENT AND WAVELENGTH CONVERSION LIGHT PULSE...

NON-LINEAR OPTICAL CRYSTAL AND METHOD FOR MANUFACTURING SAME, AND T...

ELECTRIC FIELD VECTOR DETECTION METHOD AND ELECTRIC FIELD VECTOR DE...

TERAHERTZ-WAVE SPECTROMETER

TOTAL REFLECTION SPECTROSCOPIC MEASUREMENT METHOD

TERAHERTZ-WAVE SPECTROMETER AND PRISM MEMBER

ELECTROMAGNETIC WAVE DETECTION DEVICE

TOTAL REFLECTION TERAHERTZ WAVE MEASUREMENT DEVICE

TERAHERTZ WAVE GENERATION DEVICE

OPTICAL ELEMENT, LASER BEAM OSCILLATION DEVICE AND LASER BEAM AMPLI...

OPTICAL AMPLIFYING DEVICE

SINGLE TERAHERTZ WAVE TIME-WAVEFORM MEASURING DEVICE

TOTAL REFLECTION TERA HERTZ WAVE MEASURING APPARATUS

Fast particle generating apparatus

Target for generating deuteron and target apparatus for generating...

Method for generating high-speed particle and system for generating...

Terahertz wave spectrometer