Hironori Tanaka

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Power supply apparatus for test apparatus
- Patent number 8,547,265
- Issue date Oct 1, 2013
- Advantest Corporation
- Takahiko Shimizu
- G01 - MEASURING TESTING
Information Patent Grant
Voltage generating apparatus, current generating apparatus, and tes...
- Patent number 7,605,584
- Issue date Oct 20, 2009
- Advantest Corporation
- Hiroki Andoh
- G01 - MEASURING TESTING
Information Patent Grant
Voltage generating apparatus, current generating apparatus, and tes...
- Patent number 7,456,627
- Issue date Nov 25, 2008
- Advantest Corporation
- Hiroki Andoh
- G01 - MEASURING TESTING
Information Patent Grant
Voltage generating apparatus, current generating apparatus, and tes...
- Patent number 7,345,467
- Issue date Mar 18, 2008
- Advantest Corporation
- Hiroki Andoh
- G01 - MEASURING TESTING
Information Patent Grant
Power source apparatus
- Patent number 7,277,303
- Issue date Oct 2, 2007
- Advantest Corporation
- Hironori Tanaka
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Power source apparatus
- Patent number 7,123,493
- Issue date Oct 17, 2006
- Advantest Corporation
- Hironori Tanaka
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Testing apparatus
- Patent number 7,119,547
- Issue date Oct 10, 2006
- Advantest Corporation
- Kunihiro Matsuura
- G01 - MEASURING TESTING
Information Patent Grant
Coaxial cable unit, test apparatus, and CPU system
- Patent number 7,098,647
- Issue date Aug 29, 2006
- Advantest Corporation
- Hironori Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Source current measurement apparatus and test apparatus
- Patent number 6,956,393
- Issue date Oct 18, 2005
- Advantest Corporation
- Hironori Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Electron device testing apparatus having high current and low curre...
- Patent number 6,781,364
- Issue date Aug 24, 2004
- Advantest Corporation
- Yoshitaka Kawasaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
POWER SUPPLY APPARATUS FOR TEST APPARATUS
- Publication number 20110309960
- Publication date Dec 22, 2011
- Advantest Corporation
- Takahiko Shimizu
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE GENERATING APPARATUS, CURRENT GENERATING APPARATUS, AND TES...
- Publication number 20090072802
- Publication date Mar 19, 2009
- Advantest Corporation
- Hiroki Andoh
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE GENERATING APPARATUS, CURRENT GENERATING APPARATUS, AND TES...
- Publication number 20080088287
- Publication date Apr 17, 2008
- Advantest Corporation
- Hiroki Andoh
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE GENERATING APPARATUS, CURRENT GENERATING APPARATUS, AND TES...
- Publication number 20080074133
- Publication date Mar 27, 2008
- Advantest Corporation
- Hiroki Andoh
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE GENERATING APPARATUS, CURRENT GENERATING APPARATUS, AND TES...
- Publication number 20070296400
- Publication date Dec 27, 2007
- Advantest Corporation
- Hiroki Andoh
- G01 - MEASURING TESTING
Information Patent Application
DC TEST APPARATUS
- Publication number 20070262778
- Publication date Nov 15, 2007
- Advantest Corporation
- Hiroki Ando
- G01 - MEASURING TESTING
Information Patent Application
Direct current test apparatus
- Publication number 20070103174
- Publication date May 10, 2007
- Advantest Corporation
- Hironori Tanaka
- G01 - MEASURING TESTING
Information Patent Application
Power source apparatus
- Publication number 20070008755
- Publication date Jan 11, 2007
- Advantest Corporation
- Hironori Tanaka
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Application
Power source apparatus
- Publication number 20060034105
- Publication date Feb 16, 2006
- Advantest Corporation
- Hironori Tanaka
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Application
Testing apparatus
- Publication number 20050174105
- Publication date Aug 11, 2005
- Kunihiro Matsuura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Coaxial cable unit, test apparatus, and CPU system
- Publication number 20050134255
- Publication date Jun 23, 2005
- Hironori Tanaka
- G01 - MEASURING TESTING
Information Patent Application
Testing apparatus
- Publication number 20030107395
- Publication date Jun 12, 2003
- Yoshitaka Kawasaki
- G01 - MEASURING TESTING

Hironori Tanaka

Person

Patents Grantslast 30 patents

Power supply apparatus for test apparatus

Voltage generating apparatus, current generating apparatus, and tes...

Voltage generating apparatus, current generating apparatus, and tes...

Voltage generating apparatus, current generating apparatus, and tes...

Power source apparatus

Power source apparatus

Testing apparatus

Coaxial cable unit, test apparatus, and CPU system

Source current measurement apparatus and test apparatus

Electron device testing apparatus having high current and low curre...

Patents Applicationslast 30 patents

POWER SUPPLY APPARATUS FOR TEST APPARATUS

VOLTAGE GENERATING APPARATUS, CURRENT GENERATING APPARATUS, AND TES...

VOLTAGE GENERATING APPARATUS, CURRENT GENERATING APPARATUS, AND TES...

VOLTAGE GENERATING APPARATUS, CURRENT GENERATING APPARATUS, AND TES...

VOLTAGE GENERATING APPARATUS, CURRENT GENERATING APPARATUS, AND TES...

DC TEST APPARATUS

Direct current test apparatus

Power source apparatus

Power source apparatus

Testing apparatus

Coaxial cable unit, test apparatus, and CPU system

Testing apparatus