Hironori Terazawa

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Ichinomiya-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device used for adjustment of output of a hall element
- Patent number 8,629,521
- Issue date Jan 14, 2014
- ON Semiconductor Trading, Ltd.
- Takashi Ogawa
- G01 - MEASURING TESTING
Information Patent Grant
Offset cancelling circuit
- Patent number 8,502,530
- Issue date Aug 6, 2013
- SANYO Semiconductor Co., Ltd.
- Takashi Ogawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20120049303
- Publication date Mar 1, 2012
- ON SEMICONDUCTOR TRADING, LTD.
- Takashi Ogawa
- G01 - MEASURING TESTING
Information Patent Application
OFFSET CANCELLING CIRCUIT
- Publication number 20100308801
- Publication date Dec 9, 2010
- Sanyo Electric Co., Ltd.
- Takashi OGAWA
- G01 - MEASURING TESTING