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Hironori Tsugane
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Kanagawa, JP
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last 30 patents
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Patent Grant
Longitudinal type high frequency probe for narrow pitched electrodes
Patent number
6,310,483
Issue date
Oct 30, 2001
NEC Corporation
Toru Taura
G01 - MEASURING TESTING
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Patent Grant
High-frequency probe capable of adjusting characteristic impedance...
Patent number
6,242,930
Issue date
Jun 5, 2001
NEC Corporation
Kouji Matsunaga
G01 - MEASURING TESTING