Hiroo Ito

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device tester and method of testing semiconductor device
- Patent number 6,433,410
- Issue date Aug 13, 2002
- NEC Corporation
- Michinobu Tanioka
- G01 - MEASURING TESTING
Information Patent Grant
Large-scale integrated circuit and method for testing a board of same
- Patent number 6,343,365
- Issue date Jan 29, 2002
- NEC Corporation
- Hajime Matsuzawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HEAT SINK
- Publication number 20110056650
- Publication date Mar 10, 2011
- HIROO ITO
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
WAFER AND TEMPERATURE TESTING METHOD OF THE SAME
- Publication number 20090216388
- Publication date Aug 27, 2009
- Hiroo Ito
- G05 - CONTROLLING REGULATING
Information Patent Application
Semiconductor device tester and method of testing semiconductor device
- Publication number 20010033010
- Publication date Oct 25, 2001
- Michinobu Tanioka
- G01 - MEASURING TESTING