Hiroo Nakamura

Follow

Person

Kazo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device testing apparatus and semiconductor device tes...
- Patent number 6,433,294
- Issue date Aug 13, 2002
- Advantest Corporation
- Shin Nemoto
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing apparatus and semiconductor device tes...
- Patent number 6,066,822
- Issue date May 23, 2000
- Advantest Corporation
- Shin Nemoto
- G01 - MEASURING TESTING