Hiroo Ota

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Kanagawa-ken, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor memory and method of testing semiconductor memory
- Patent number 6,731,561
- Issue date May 4, 2004
- Kabushiki Kaisha Toshiba
- Mitsuhiro Abe
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor memory and method of testing semiconductor memory
- Publication number 20020176306
- Publication date Nov 28, 2002
- Mitsuhiro Abe
- G11 - INFORMATION STORAGE