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Hiroo TAMURA
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Positioning and fixing device
Patent number
10,732,220
Issue date
Aug 4, 2020
Tokyo Seimitsu Co., Ltd.
Hiroo Tamura
G01 - MEASURING TESTING
Information
Patent Grant
Prober
Patent number
10,510,574
Issue date
Dec 17, 2019
Tokyo Seimitsu Co., Ltd.
Hiroo Tamura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Prober
Patent number
10,338,101
Issue date
Jul 2, 2019
Tokyo Seimitsu Co., Ltd.
Hiroo Tamura
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PROBER AND TEMPERATURE MEASUREMENT METHOD
Publication number
20240329118
Publication date
Oct 3, 2024
TOKYO SEIMITSU CO., LTD.
Hiroo Tamura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PROBER
Publication number
20190019711
Publication date
Jan 17, 2019
TOKYO SEIMITSU CO., LTD.
Hiroo Tamura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PROBER
Publication number
20180017594
Publication date
Jan 18, 2018
TOKYO SEIMITSU CO., LTD.
Hiroo TAMURA
G01 - MEASURING TESTING
Information
Patent Application
POSITIONING AND FIXING DEVICE
Publication number
20170146595
Publication date
May 25, 2017
TOKYO SEIMITSU CO., LTD.
Hiroo TAMURA
G01 - MEASURING TESTING