Hiroo TAMURA

Person

  • Tokyo, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Positioning and fixing device

    • Patent number 10,732,220
    • Issue date Aug 4, 2020
    • Tokyo Seimitsu Co., Ltd.
    • Hiroo Tamura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Prober

    • Patent number 10,510,574
    • Issue date Dec 17, 2019
    • Tokyo Seimitsu Co., Ltd.
    • Hiroo Tamura
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Prober

    • Patent number 10,338,101
    • Issue date Jul 2, 2019
    • Tokyo Seimitsu Co., Ltd.
    • Hiroo Tamura
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    PROBER AND TEMPERATURE MEASUREMENT METHOD

    • Publication number 20240329118
    • Publication date Oct 3, 2024
    • TOKYO SEIMITSU CO., LTD.
    • Hiroo Tamura
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    PROBER

    • Publication number 20190019711
    • Publication date Jan 17, 2019
    • TOKYO SEIMITSU CO., LTD.
    • Hiroo Tamura
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    PROBER

    • Publication number 20180017594
    • Publication date Jan 18, 2018
    • TOKYO SEIMITSU CO., LTD.
    • Hiroo TAMURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    POSITIONING AND FIXING DEVICE

    • Publication number 20170146595
    • Publication date May 25, 2017
    • TOKYO SEIMITSU CO., LTD.
    • Hiroo TAMURA
    • G01 - MEASURING TESTING