Hiroshi Akasaki

Person

Ome, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor memory device
- Patent number 7,184,330
- Issue date Feb 27, 2007
- Hitachi, Ltd.
- Kenichi Tajima
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit device, method of testing semicond...
- Patent number 7,162,671
- Issue date Jan 9, 2007
- Hitachi, Ltd.
- Masatoshi Hasegawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit having programmable delays for gen...
- Patent number 7,113,434
- Issue date Sep 26, 2006
- Renesas Technology Corp.
- Hiroshi Akasaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit device, method of testing semicond...
- Patent number 6,794,678
- Issue date Sep 21, 2004
- Hitachi, Ltd.
- Masatoshi Hasegawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 6,735,129
- Issue date May 11, 2004
- Renesas Technology Corp.
- Hiroshi Akasaki
- G11 - INFORMATION STORAGE
Information Patent Grant
High speed clock synchronous semiconductor memory in which the colu...
- Patent number 6,570,800
- Issue date May 27, 2003
- Hitachi, Ltd.
- Yousuke Tanaka
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for forming a silicide layer and barrier layer on a semicond...
- Patent number 5,217,922
- Issue date Jun 8, 1993
- Hitachi, Ltd.
- Hiroshi Akasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of bonding metals, and method and apparatus for producing se...
- Patent number 5,188,280
- Issue date Feb 23, 1993
- Hitachi Ltd.
- Takashi Nakao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pin-grid array semiconductor device
- Patent number 5,107,329
- Issue date Apr 21, 1992
- Hitachi, Ltd.
- Takayuki Okinaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of bonding metals, and method and apparatus for producing se...
- Patent number 5,090,609
- Issue date Feb 25, 1992
- Hitachi, Ltd.
- Takashi Nakao
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor memory device
- Publication number 20050265091
- Publication date Dec 1, 2005
- Hitachi, Ltd.
- Kenichi Tajima
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor integrated circuit device, method of testing semicond...
- Publication number 20050018461
- Publication date Jan 27, 2005
- Hitachi, Ltd.
- Masatoshi Hasegawa
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor integrated circuit device
- Publication number 20040196080
- Publication date Oct 7, 2004
- RENESAS TECHNOLOGY CORP.
- Hiroshi Akasaki
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor integrated circuit device
- Publication number 20020176292
- Publication date Nov 28, 2002
- Hitachi, Ltd.
- Hiroshi Akasaki
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor integrated circuit device, method of testing semicond...
- Publication number 20020118018
- Publication date Aug 29, 2002
- Masatoshi Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device
- Publication number 20010007539
- Publication date Jul 12, 2001
- Yousuke Tanaka
- G11 - INFORMATION STORAGE

Hiroshi Akasaki

Person

Patents Grantslast 30 patents

Semiconductor memory device

Semiconductor integrated circuit device, method of testing semicond...

Semiconductor integrated circuit having programmable delays for gen...

Semiconductor integrated circuit device, method of testing semicond...

Semiconductor integrated circuit device

High speed clock synchronous semiconductor memory in which the colu...

Method for forming a silicide layer and barrier layer on a semicond...

Method of bonding metals, and method and apparatus for producing se...

Pin-grid array semiconductor device

Method of bonding metals, and method and apparatus for producing se...

Patents Applicationslast 30 patents

Semiconductor memory device

Semiconductor integrated circuit device, method of testing semicond...

Semiconductor integrated circuit device

Semiconductor integrated circuit device

Semiconductor integrated circuit device, method of testing semicond...

Semiconductor device